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Displaying 60851 - 60875 of 74505

Benchmark for the Verification of Microwave CAD Software

December 1, 1991
Author(s)
R. Furlow, R. Y. Shimoda, Dylan Williams, Roger Marks, Kuldip Gupta
A set of microstrip structures which constitute a comprehensive benchmark for the verification of microwave Computer Aided Design (CAD) software has been developed in a collaborative effort. The benchmark is designed to exhibit a wide range of physical

Comparison of On-Wafer Calibrations

December 1, 1991
Author(s)
Dylan F. Williams, Roger Marks, A. Davidson
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration

Direct Observation of Macroscopic Charge Quantization

December 1, 1991
Author(s)
P Lafarge, H Pothier, Edwin R. Williams, D Esteve, C Urbina, Michel H. Devoret
The circuit formed by a nanoscale tunnel junction in series with a capacitance and a voltage source is the building block of most multi-junction circuits of single electronics. The state of this single electron box is entirely determined by the number n of
Displaying 60851 - 60875 of 74505
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