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Displaying 58501 - 58525 of 74192

Trends in the X-Ray Diffraction of Multilayers, in Physics of X-Ray Multilayer Structures

January 1, 1994

Author(s)

Charles Tarrio, R Deslattes, Ariel Caticha, J Pedulla

Tunable Phase-Locked Diode Lasers for Precision Spectroscopy

January 1, 1994

Author(s)

L D. D'evelyn, Leo W. Hollberg, Richard W. Fox, Z B. Popovic

Tunneling Spectroscopy of Thallium-Based High-Temperature Superconductors

January 1, 1994

Author(s)

John M. Moreland, J. A. Aust

U p , 3U p , 11U p : Above-threshold ionization revisited, in Quantum Optics III, Szczyrk, Poland, September 1993

January 1, 1994

Author(s)

B Yang, K J. Schafer, B Walker, K C. Kulander, L F. Demauro, P Agostini

U.S. Navy Coordinate Measuring Machines: A Study of Needs

January 1, 1994

Author(s)

David C. Stieren, Ralph C. Veale, Howard H. Harary, Shaw C. Feng

Abstract not available.

Ultrafast Transient Infrared Absorption Studies of M(CO) 6 (M=Cr, Mo, W) Photoproducts in n-Hexane Solution

January 1, 1994

Author(s)

T P. Dougherty, Edwin J. Heilweil

Ultrashallow Depth Profiling with Time-of-flight Secondary Ion Mass Spectrometry

January 1, 1994

Author(s)

J. Bennett, John A. Dagata

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an efficient, sensitive method for characterizing semiconductor surfaces. In addition, TOF-SIMS can be applied in a depth profiling mode allowing qualitative characterization of the top 10?20 nm

Uncertainties in Dimensional Measurements Made at Nonstandard Temperatures

January 1, 1994

Author(s)

Dennis A. Swyt

This report examines the effects of uncertainties in temperature and coefficient of thermal expansion on the expanded uncertainty of length dimensional measurements made away from the international standard reference temperature of 20degrees C for artifact

Updated Calculations for Routine Space-Shielding Radiation Dose Estimates: SHIELDOSE-2

January 1, 1994

Author(s)

Stephen M. Seltzer

User's guide for the PHIGS Validation Tests (version 2.1):

January 1, 1994

Author(s)

Qiming Wang

User's manual for the program MONSEL-1:

January 1, 1994

Author(s)

Jeremiah R Lowney, Egon Marx

Using NASREM for Real-Time Sensory Interactive Robot Control

January 1, 1994

Author(s)

Ronald Lumia

Using NASREM for Telerobot Control System Development

January 1, 1994

Author(s)

Ronald Lumia

NASA, Control, Standards

Using Secondary Ion Mass Spectrometry (SIMS) to Characterize Optical Waveguide Materials

January 1, 1994

Author(s)

S. W. Novak, J. M. Zavada, K. J. Malone

Using SONET to Provide Precise Time Synchronization

January 1, 1994

Author(s)

Marc A. Weiss

Utility of the Spread Function in Reflectometric Applications and Design

January 1, 1994

Author(s)

Benjamin K. Tsai, D P. DeWitt, G H. Shaffer

Validated Products List 1994 NO.1

January 1, 1994

Author(s)

Judy B. Kailey, Peggy N. Himes

VAMAS Intercomparison of Critical Current Measurements on NB 3 SN Superconductors: A Summary Report

January 1, 1994

Author(s)

H Wada, C R. Walters, Loren F. Goodrich, K Tachikawa

Variable Groove Spaced Grating Monochromators for Synchrotron Light Sources,

January 1, 1994

Author(s)

M Haass, J -. Jia, T A. Callcott, D L. Ederer, K E. Miyano, R N. Watts, D R. Mueller, Charles Tarrio, E Morikawa

Variations in Size Measurements by Indicating Gaging Systems

January 1, 1994

Author(s)

Ralph C. Veale, A Strang, S Merrit, H Chou

The National Institute of Standards and Technology has investigated the efficacy of indicating gaging systems used to measure pitch diameter and functional size of threaded fasteners. Three external systems and four internal systems, representing four