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Displaying 58476 - 58500 of 74192

Threshold K-LL Auger Spectra of P in InP

January 1, 1994
Author(s)
H Wang, J C. Woicik, T berg, M H. Chen, A Herrera-gomez, T Kendelewicz, A M {?}ntykentt {?}, K E. Miyano, S H. Southworth, B Crasemann

Traceable Standards for Scanning Electron Microscopy

January 1, 1994
Author(s)
Michael T. Postek
The emphasis on International Standards Organization (ISO) certification of laboratories has resulted in a renewed interest in NIST traceable standards for scanning electron microscopy (SEM). Under ISO certification, it is mandatory to calibrate and
Displaying 58476 - 58500 of 74192
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