Shih, C.
and Colton, R.
(1994),
Industrial applications of scanned probe microscopy:, , National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.5550
(Accessed October 15, 2024)
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Industrial applications of scanned probe microscopy:
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- NIST IR 5550
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NIST IR 5550
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NIST Pubs
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Created January 1, 1994, Updated May 19, 2023