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Displaying 56101 - 56125 of 74175

Self-Calibration: Reversal, Redundancy, Error Separation, and "Absolute Testing"

January 1, 1996
Author(s)
Christopher J. Evans, R Hocken, William T. Estler
Over the years many techniques have been developed for accurate measurement of part features without reference to an externally calibrated artifact. This paper presents a partial survey of such methods for dimensional metrology, their ranges of application

SEM Image Sharpness Analysis

January 1, 1996
Author(s)
Michael T. Postek, Andras Vladar
The technique described here, utilizing the sharpness concept, is facilitated by the use of the FFT techniques to analyze the electron micrograph to obtain the evaluation. This is not the first application of Fourier techniques to SEM images, but it is the

Sharing Manufacturing Information between Heterogeneous Corporations

January 1, 1996
Author(s)
KC Morris, Martin Hardwick, D L. Spooner, T Rando
Recent advances in communications technology are making it possible for manufacturing corporations to transmit data to each other in fractions of a second. However, if the corporations use different tools, understanding of the data may be delayed for weeks

SIMA reference architecture, part 1::activity models

January 1, 1996
Author(s)
Edward J Barkmeyer, Neil Christopher, Shaw C Feng, James E Fowler, Simon P Frechette, Albert Jones, Kevin Jurrens, Kevin Lyons, Charles R McLean, Michael Pratt, Harry A Scott, M Kate Senehi, Ram D Sriram, Evan K Wallace
Displaying 56101 - 56125 of 74175
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