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Displaying 56126 - 56150 of 74175

Spatial and Time Characteristics of Low Temperature RF Plasmas for Materials Processing

January 1, 1996

Author(s)

Sophie Djordjevic, J R. Roberts, James K. Olthoff

Specification for interoperability between ballistic imaging systems::part 1- cartridge cases

January 1, 1996

Author(s)

Bruce F Field, Edward F Kelley, R Michael McCabe

Spectroradiometers for Deep-Ultraviolet Lithography, ed. by W.M. Bullis, D.G. Seiler, and A.C. Diebold

January 1, 1996

Author(s)

John M. Bridges, Jonathan E. Hardis, C L. Cromer, J R. Roberts

Specular and Diffuse Reflection Measurements of Electronic Displays

January 1, 1996

Author(s)

G R. Jones, Edward F. Kelley, Thomas Germer

Spin-Dependent Interface Transmission and Reflection in Magnetic Multilayers

January 1, 1996

Author(s)

Mark D. Stiles

First-principles calculations of transmission and reflection from Ag/Fe, Au/Fe, Cu/Co, and Cu/Ni interfaces show very strong spin dependence that differs signifcantly from expectations based on free electron approximations. The results can be used to

Spin-Dependent Orientation Propensities Revealed in Polarized-Electron-Polarized-Photon Coincidence Studies

January 1, 1996

Author(s)

N Andersen, K Bartschat, J T. Broad, G F. Hanne, M Uhrig

Stable Silicon Photodiodes for Absolute Intensity Measurements in the VUV and Soft X-Ray Regions

January 1, 1996

Author(s)

Eric M. Gullikson, R Korde, L R. Canfield, Robert E. Vest

Standard Grade Rockwell Diamond Indenters - A Key to a Worldwide Unified Rockwell Hardness Scale

January 1, 1996

Author(s)

Jun-Feng Song, Samuel R. Low III, David J. Pitchure, Theodore V. Vorburger

Since the 1980's, the European Community (EC) has established a unified Rockwell C hardness (HRC) scale by averaging several national scales, which come from each country''s national hardness machines and diamond indenters. These indenters have significant

Standard Grade Rockwell Diamond Indenters - A Key to a Worldwide Unified Rockwell Hardness Scale (in Japanese)

January 1, 1996

Author(s)

Jun-Feng Song, Theodore V. Vorburger

Since the 1980''s, the European Community (EC) has established a unified Rockwell C hardness (HRC) scale by averaging several national scales, which come from each country''s national hardness machines and diamond indenters. These indenters have

Standard Reference Materials ::Statistical aspects of the certification of chemical batch SRMs/

January 1, 1996

Author(s)

Susannah B Schiller

Standard Reference Materials:The NIST traceable reference material program for gas standards

January 1, 1996

Author(s)

William D Dorko, George C Rhoderick, Franklin R Guenther

Standards activities of organizations in the United States, 1996 edition:

January 1, 1996

Author(s)

Robert B Toth, Robert B Toth

Standards promote credibility and technology transfer::the need for greater industry support of technical committees

January 1, 1996

Author(s)

C Denver Lovett

State of the art report on seismic design requirements for nonstructural building components:

January 1, 1996

Author(s)

Long T Phan, Andrew W Taylor

State of the MEL computing and networking infrastructure:

January 1, 1996

Author(s)

Deborah Nickerson Fowler

State weights and measures laboratories: program handbook:

January 1, 1996

Author(s)

Georgia L Harris

State-resolved differential scattering in open-shell collisions: Cl( 2 P 3/2 ) + HCl from high-resolution IR laser Dopplerimetry

January 1, 1996

Author(s)

Z L. Zhao, W B. Chapman, David Nesbitt

State-to-state, rotational energy-transfer dynamics in crossed supersonic jets: A high-resolution IR absorption method

January 1, 1996

Author(s)

A Schiffman, W B. Chapman, David Nesbitt

Static Structural Analysis of a Reconfigurable Rigid Platform Supported by Elastic Legs

January 1, 1996

Author(s)

F Rudder

This report describes a static structural analysis of a rigid planar platform supported by elastic legs. The platform deformations are computed relative to a specified platform position and orientation. The analysis considers deformation due to static

Static structural analysis of a reconfigurable rigid platform supported by elastic legs:

January 1, 1996

Author(s)

F F Jr Rudder

Statistical Models for Estimating the Measurement of Pitch in Metrology Instruments

January 1, 1996

Author(s)

Nien F. Zhang, Michael T. Postek, Robert D. Larrabee

The measurement of pitch in metrology instruments is through to be a benign self-compensating function. In the course of issuing the new scanning electron microscope standard SRM 2090, a new algorithm for the measurement of pitch was developed. This is