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Displaying 54801 - 54825 of 74165

Pitch and Step Height Measurements Using NIST

January 1, 1997
Author(s)
R Koning, Ronald G. Dixson, Joseph Fu, V W. Tsai, Theodore V. Vorburger, Edwin R. Williams, X Wang
The use of the atomic force microscope (AFM) for step height and pitch measurements in industrial applications is rapidly increasing. To compare the results obtained by different instruments and to achieve high accuracy, the scales of an AFM must be

Proceedings of the First Process Specification Language (PSL) Roundtable

January 1, 1997
Author(s)
Craig I. Schlenoff, Amy Knutilla, Steven R. Ray
On April, 1997, the Process Specification Language (PSL) Project held a Roundtable discussion at the National Institute of Standards and Technology (NIST). The goal of the Roundtable was to assemble key champions and stakeholders of various

Production of Two Overlapping Bose-Einstein Condensates by Sympathetic Cooling

January 1, 1997
Author(s)
C J. Myatt, E A. Burt, R W. Ghrist, Eric A. Cornell, C E. Wieman
A double magneto-optic trap apparatus with a number of desirable features was used to create condensates of 2x10 6 atoms in either of the F=2, m=2 or F=1, m=-1 spin states of 87Rb. Overlapping condenstates of the two states were also created using nearly
Displaying 54801 - 54825 of 74165
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