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Displaying 54526 - 54550 of 73697

Uncertainty analysis for NRaD radar cross section measurements:

January 1, 1997

Author(s)

G A Kinzel, R C Wittmann, L A Muth

Uniform laws and regulations in the areas of legal metrology and motor fuel quality:

January 1, 1997

Author(s)

Kenneth Butcher, Terry L Grimes

Update to Nuclear Data Standards for Nuclear Measurements

January 1, 1997

Author(s)

Allan D. Carlson, S Chiba, F-J Hambsch, N Olsson, A N. Smirnov

Uptake of NO 3 onto Water Solutions: Rate Coefficients for Reactions of NO 3 with Cloud Water

January 1, 1997

Author(s)

T Imamura, Y Rudich, R K. Talukdar, Richard W. Fox, A R. Ravishankara

Usability engineering:

January 1, 1997

Author(s)

Laura L Downey, Sharon J Laskowski

Use of computational fluid dynamics to analyze indoor air quality issues:

January 1, 1997

Author(s)

Steven J Emmerich

Use of quality assurance systems in the fastener industry:

January 1, 1997

Author(s)

D E Edgerly

Using S-Check ML, version 3.0:

January 1, 1997

Author(s)

Robert Snelick, Nathalie Drouin, John Antonishek, Mike Indovina, Michel Courson

UV, Soft X-Ray, and Gamma-Ray High-Resolution Imaging and Discrimination by a Novel Photo-Polymer Film System

January 1, 1997

Author(s)

M Al-sheikhly, W L. Mclaughlin, A Christou, C A. Christou

Velocity dependence of energy pooling collisions in strontium

January 1, 1997

Author(s)

J A. Neuman, J Cooper, A Gallagher

Velocity Distributions Calculated from the Fourier Transforms at Ramsey Lineshapes

January 1, 1997

Author(s)

Jon H. Shirley

Virtual Supply Chain Management: A Re-Engineering Approach Using Discrete Event Simulation

January 1, 1997

Author(s)

Shigeki Umeda, Albert W. Jones

Modern manufacturing enterprises must collaborate with a large number of suppliers to design and produce their products. Management of these supply chains is crucial. This paper proposes a framework for supply chain management, which will form the

Water Calorimetry: The Heat Defect

January 1, 1997

Author(s)

Norman V. Klassen, C K. Ross

White Layers and Thermal Modeling of Hard Turned Surfaces

January 1, 1997

Author(s)

Y K. Chou, Christopher J. Evans

White layers in hard turned surfaces are identified, characterized and measured as a function of tool flank wear and cutting speed. White layer depth generally increases with flank wear. It also increases with speed, but approaches an asymptote. A thermal

Why Experimentalists Mistrust Computer Modeling--and Why They Rely on It

January 1, 1997

Author(s)

Judah Levine

Working Group 1: Atomic Spectra and Wavelength Standard

January 1, 1997

Author(s)

William C. Martin

Workshop Discussion: A Framework for Standards Development and the Future of the IASPM Workshops

January 1, 1997

Author(s)

John A. Dagata

A proposal to develop the Industrial Applications of Scanned Probe Microscopy (IASPM) workshops, which NIST has co-sponsored with Sematech, the ASTM E42.14 subcommittee, and the American Vacuum Society, over the past four years into a forum for assisting