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Displaying 52951 - 52975 of 74260

A Simplified Ultrasonic Immersion Technique for Materials Evaluation

January 1, 1998
Author(s)
D Xiang, Nelson N. Hsu, Gerald V. Blessing
A simplified ultrasonic immersion technique has been developed to measure leaky surface and bulk waves in solid materials by using specially designed lensless, line focus polyvinylidene fluoride (PVDF) transducers with a large aperture and a short focal

A Simulation-Based BRP Support System for Supply Chain Management

January 1, 1998
Author(s)
Shigeki Umeda, Albert W. Jones
Modern manufacturing enterprises must collaborate with a large number of suppliers to design and produce their products. Management of these supply chains is crucial. This paper proposes a simulation-based supply chain management system, which supports the

Absolute Silicon Photodiodes for 160 nm to 254 nm Photons

January 1, 1998
Author(s)
L R. Canfield, Robert E. Vest, R Korde, H Schmidtke, R Desor
Silicon n-on-p photodiodes with 100% internal efficiency have been studied in the 160 nm to 254 nm range. Preliminary values for the quantum yield of silicon, a fundamantal property, are determined. Using these values, a trap detector for absolute flux
Displaying 52951 - 52975 of 74260
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