Paterson, D.
, Han, T.
, Tran, C.
, Hudson, L.
, Serpa, F.
and Deslattes, R.
(1998),
Absolute Calibration of an X-Ray Spectrometer on the NIST Electron-Beam Ion Trap: Control, Design and Systematics, Physica Scripta
(Accessed May 7, 2024)
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Absolute Calibration of an X-Ray Spectrometer on the NIST Electron-Beam Ion Trap: Control, Design and Systematics
Published
Author(s)
D J. Paterson, T. Han, C Q. Tran, , ,
Abstract
The course of Electron-Beam Ion Trap (EBIT) experiments depends more and more on precision measurement. To design and test a system of absolute spectroscopy to 10-20 parts per million for such a source is a challenging task. Other design criteria include good efficiency in the 3-10 keV energy range, ability to focus a line source and high vacuum compatibility. Some difficulties are discussed. The use of a non-scanning Johann focussing spectrometer and its consequent calibration is discussed. The spectrometer has been used in a series of experiments on the NIST EBIT. The detector location is shown (both experimentally and by modelling) to provide a major systematic contribution, which can however be controlled to a suitable tolerance. Future directions are indicated.Citation
Physica Scripta
Volume
T73
Pub Type
Journals
Keywords
absolute spectroscopy, Electron-Beam Ion Trap (EBIT)
Citation
Created December 31, 1997, Updated October 12, 2021