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Absolute Calibration of an X-Ray Spectrometer on the NIST Electron-Beam Ion Trap: Control, Design and Systematics

Published

Author(s)

D J. Paterson, T. Han, C Q. Tran, Lawrence T. Hudson, F Serpa, R Deslattes

Abstract

The course of Electron-Beam Ion Trap (EBIT) experiments depends more and more on precision measurement. To design and test a system of absolute spectroscopy to 10-20 parts per million for such a source is a challenging task. Other design criteria include good efficiency in the 3-10 keV energy range, ability to focus a line source and high vacuum compatibility. Some difficulties are discussed. The use of a non-scanning Johann focussing spectrometer and its consequent calibration is discussed. The spectrometer has been used in a series of experiments on the NIST EBIT. The detector location is shown (both experimentally and by modelling) to provide a major systematic contribution, which can however be controlled to a suitable tolerance. Future directions are indicated.
Citation
Physica Scripta
Volume
T73

Keywords

absolute spectroscopy, Electron-Beam Ion Trap (EBIT)

Citation

Paterson, D. , Han, T. , Tran, C. , Hudson, L. , Serpa, F. and Deslattes, R. (1998), Absolute Calibration of an X-Ray Spectrometer on the NIST Electron-Beam Ion Trap: Control, Design and Systematics, Physica Scripta (Accessed May 17, 2024)

Issues

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Created December 31, 1997, Updated October 12, 2021