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A New Neutron Interferometric Method Used to Measure the Scattering Length of Silicon

Published

Author(s)

A I. Ioffe, David L. Jacobson, Muhammad D. Arif, M Vrana, S. A. Werner, P Fischer, G Greene, F Mezei
Citation
Physica B-Condensed Matter
Volume
241

Citation

Ioffe, A. , Jacobson, D. , Arif, M. , Vrana, M. , Werner, S. , Fischer, P. , Greene, G. and Mezei, F. (1998), A New Neutron Interferometric Method Used to Measure the Scattering Length of Silicon, Physica B-Condensed Matter (Accessed February 29, 2024)
Created December 31, 1997, Updated October 12, 2021