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Displaying 52151 - 52175 of 74034

The Magnification of Conic Mirror Reflectometers

July 1, 1998
Author(s)
K A. Snail, Leonard Hanssen
Conic mirror reflectometers are used to measure the diffuse reflectance and total integrated scatter of surfaces. In spite of the long history of using conic mirrors for these purposes, the maximum magnification of the three primary types of conic mirrors

Truncating the Singular Value Decomposition for Ill-Posed Problems

July 1, 1998
Author(s)
Bert W. Rust
Discretizing the first-kind integral equations which model many physical measurement processes yields an ill-conditioned linear regression model. Least squares estimation usually gives a sum of squared residuals much smaller than the expected value and a

Use of Kirkpatrick-Baez Multilayer Optics for X-Ring Fluorescence Imaging

July 1, 1998
Author(s)
A S. Bakulin, S M. Durbin, C Liu, J Erdmann, A T. Macrander, Terrence J. Jach
We discuss the possibilities for using Kirkpatrick-Baez (K-B) multilayer elements to directly image the fluorescence distribution from a specimen under x-ray illumination. X-ray fluorescence would be collected by K-B elements close in contrast to the use

Culture Conflicts in Software Engineering Technology Transfer

June 30, 1998
Author(s)
M V. Zelkowitz, D Wallace, D W. Binkley
Although the need to transition new technology to improve the process of developing quality software products is well understood, the computer software industry has done a poor job of carrying out that need. All toooften new software technology is touted

Metric Models for Random Graphs

June 30, 1998
Author(s)
D L. Banks, G Constantine
Many problems entail the analysis of data that are independent and identically distributed random graphs. Useful inference requires flexible probability models for such random graphs; these models should have interpretable location and scale parameters

Infrared Diffuse Reflectance Instrumentation and Standards at NIST

June 29, 1998
Author(s)
Leonard M. Hanssen, Simon G. Kaplan
A spectrophotometer system for spectral characterization of materials in the infrared has been built around a bench-top Fourier transform (FTIR) instrument. Its capabilities include the measurement of directional-hemispherical reflectance from 1 *m to 18

Effect of P o2 and Ag on the Phase Formation of the Pb-2223 Superconductor

June 25, 1998
Author(s)
Winnie K. Wong-Ng, Lawrence P. Cook, W Greenwood
The chemical reactions and the compositional characteristics of liquids which lead to the phase formation of the Pb-2223 ((Bi,Pb):Sr:Ca:Cu:O) superconductor have been studied for a precursor composition of Bi 1.8Pb o.4Sr 2Ca 2.2Cu 3O x. The combined

Issues in Evaluating Face Recognition Algorithms

June 22, 1998
Author(s)
P J. Phillips, R. McCabe, R Chellappa
Biometric-based identification and verification systems are poised to become a key technology, with applications including controlling access to buildings and computers, reducing fraudulent transactions in electronic commerce, and discouraging illegal
Displaying 52151 - 52175 of 74034
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