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Displaying 51901 - 51925 of 74483

A Theoretically-Based Calibration and Evaluation Procedure for Vibrating-Tube Densimeters

December 1, 1998

Author(s)

C D. Holcomb, Stephanie L. Outcalt

A UHV-Compatible Two-Crystal Monochromator for Synchrotron Radiation

December 1, 1998

Author(s)

P L. Cowan, J B. Hastings, Terrence J. Jach, J P. Kirkland

Accreditation Requirements for Quality System Registrars Under Provisions of the Fastener Quality Act

December 1, 1998

Author(s)

S. W. Stiefel, R L. Gladhill

On November 16, 1990, the United States Congress enacted the Fastener Quality Act (FQA), P.L. 101-592 (the Act). The Act was amended in 1996 by Section 11 of P.L. 104-113. The Act protects the public safety by: (1) requiring that certain fasteners which

Accuracy Differences Among Photomask Metrology Tools and Why They Matter

December 1, 1998

Author(s)

James E. Potzick

A variety of different kinds of photomask critical dimensions (CD) metrology tools are available today to help meet current and future metrology challenges. These tools are based on different operating principles, and have different cost, throughput

Accuracy vs. Efficiency Trade-offs in Optical Flow Algorithms

December 1, 1998

Author(s)

H Liu, Tsai H. Hong, Martin Herman, Theodore(Ted) Camus, Rama Chellappa

Vision, Mobility

Advanced SEM Imaging

December 1, 1998

Author(s)

D. C. Joy, Dale Newbury

Airtightness of Commercial and Institutional Buildings: Blowing Holes in the Myth of Tight Buildings

December 1, 1998

Author(s)

Andrew K. Persily

It is often assumed that commercial and institutional buildings are fairly airtight and that envelope air leakage does not have a significant impact on energy consumption and indoor air quality in these buildings. Furthermore, it is also assumed that more

Analysis and Comparison of Various Image Downsampling and Unsampling Methods

December 1, 1998

Author(s)

Abdou S. Youssef

Downsampling and upsampling are widely used in image display, and jointly used in compression and progressive transmission. In this paper we examine new down/upsampling methods using both frequency response analysis and experimental evaluation. Our

Analysis of the Degradation of Polyethylene in Air Using Electrical and Physical Data

December 1, 1998

Author(s)

J. C. Horwath, D. L. Schweickart, Yicheng Wang

Discharge currents and degradation of polyethylene from high dc electric field stress in air were investigated. A positive point-to-plane configuration was used with thin polyethylene samples on the cathode surface. Voltage, spacing and relative humidity

Annealed Fiber: Properties and Applications

December 1, 1998

Author(s)

Allen Rose, Robert J. Espejo, Rex M. Craig

Annotated Bibliography: Works by Staff of the Economic Assessment Office and its Contractors

December 1, 1998

Author(s)

R N. Spivack

This annotated bibliography contains all of the completed studies of the ATP prepared by the staff of the Economic Assessment Office and its contractors.

Application of Capillary Optics to Neutron Radiography

December 1, 1998

Author(s)

K M. Podurets, D F. Mildner, V. A. Sharov

Application of Genomic Gene Enrichment For Enhancing the Sensitivity of the Ligation-Mediated Polymerase Chain Reaction

December 1, 1998

Author(s)

H Rodriguez, S. A. Akman

Application of the Extended Corresponding States Method to the Calculation of the Ammonia-Water Mixture Thermodynamic Surface

December 1, 1998

Author(s)

A Nowarski, Daniel G. Friend

Applications of Electron-Interaction Reference Data to the Semiconductor Industry

December 1, 1998

Author(s)

Loucas G. Christophorou, James K. Olthoff

Many advanced plasma diagnostic techniques and plasma models require fundamental physical data in order to make accurate measurements or predictions. Fundamental electron-interaction data are among the most critical since electron collisions are the

Beam Effects, Surface Topography, and Depth Profiling in Surface and Near-Surface Analysis

December 1, 1998

Author(s)

A W. Czanderna, T E. Madey, Cedric J. Powell

Bench-Scale Testing of Surfactant-Modified Reverse Osmosis/Nanofiltration Membranes

December 1, 1998

Author(s)

M C. Wilbert, J J. Pellegrino, A Zydney

Binary Mixtures In and Beyond the Critical Region: Thermodynamic Properties

December 1, 1998

Author(s)

S B. Kiselev, James C. Rainwater, Marcia L. Huber

Calibration Wafer for Temperature Measurements in RTP Tools

December 1, 1998

Author(s)

Kenneth G. Kreider, D P. Dewitt, B K. Tsai, F J. Lovas, D W. Allen

Characteristics of Partial Discharges on a Dielectric Surface in SF 6 -N 2 Mixtures

December 1, 1998

Author(s)

X. Han, Yicheng Wang, Loucas G. Christophorou, Richard J. Van Brunt

An important tool for improving the reliability of HV-insulation systems relies on partial discharge (PD) measurements. The assessment of the insulation failure of HV equipment using PD measurements requires an interpretation of the PD measurements

Characterization and Applications of On-Wafer Diode Noise Sources

December 1, 1998

Author(s)

Lawrence P. Dunleavy, James P. Randa, Dave K. Walker, Robert L. Billinger, John Rice

A set of wafer-probeable diode noise source transfer standards are characterized using on-wafer noise-temperature methods developed at the National Institute of Standards and Technology (NIST), Boulder, CO.

Characterization of Weak, Electrically Small Emitters from TEM-Cell Measurements

December 1, 1998

Author(s)

David A. Hill, Kenneth H. Cavcey

Chemical Limits to Flame Inhibition

December 1, 1998

Author(s)

Valeri I. Babushok, Wing Tsang, Gregory T. Linteris, D Reinelt

This paper deals with the ultimate limits of chemical contributions to flame inhibition. Particular attention is focussed on the inhibition cycles which regenerate the inhibitor. This leads to the definition of an idealized "perfect" inhibition cycle. It

Chemical Limits to Flame Inhibition

December 1, 1998

Author(s)

Valeri I. Babushok, Wing Tsang, Gregory T. Linteris, D Reinelt

Chemical Vapor Deposition of Metal and Ceramic Thin Films by Sodium Vapor Phase Reduction of Metal Halide Precursors

December 1, 1998

Author(s)

Jay H. Hendricks, Michael R. Zachariah

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