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NIST Authors in Bold

Displaying 50701 - 50725 of 74160

Measurement and Standards for Computational Science and Engineering

March 1, 1999
Author(s)
Ronald F. Boisvert, J L. Blue, Daniel W. Lozier, William F. Mitchell, Roldan Pozo, Michael J. Donahue, Donald G. Porter
This report describes current work within ITL on the development of measurement and standards technology to improve the practice of computational science and engineering.

Microstructural Changes in YSZ Deposits During Annealing

March 1, 1999
Author(s)
Andrew J. Allen, J Ilavsky, Gabrielle G. Long, Jay S. Wallace, C C. Berndt, H Herman
Various methods have been applied to the microstructural characterization of thermally-sprayed depostis. However, coexisting anisotropic distributions of intra-splat cracks and interlamellar pores, and the broad size range of rounded globular pores, have

Minimizing Feature Width in Atom-Optically Fabricated Chromium Nanostructures

March 1, 1999
Author(s)
W Anderson, C Bradley, Jabez J. McClelland, Robert Celotta
We present a study of factors that influence the feature width of nanostructures formed by atom-optical direct-write lithography. In this process, chromium atoms travel through a standing-wave laser light field and are deposited on a surface. Due to the

Molecularly Dispersed Dendrimers in a Polymeric Matrix

March 1, 1999
Author(s)
Barry J. Bauer, T J. Prosa, D W. Liu, C L. Jackson, D A. Tomalia, Eric J. Amis
Interpenetrating polymer networks are formed by dissolving poly(amidoamine) dendrimers in 2-hydroxyethyl methacrylate and polymerizing with dendrimer contents between 1 and 25 mass % containing dendrimers from generation 6 through 11. Small angle x-ray

Myths About Building Envelopes

March 1, 1999
Author(s)
Andrew K. Persily
It is often assumed that commercial and institutional buildings are fairly airtight and that envelopee air leakage does not have a significant impact on energy consumption and indoor air quality in these buildings. Furthermore, it is assumed that more

Optical Linewidth Models - Then and Now

March 1, 1999
Author(s)
Robert D. Larrabee, Richard M. Silver, M P. Davidson
In the late 1970's Dr. Diana Nyyssonen demonstrated that the National Institute of Standards and Technology (NIST) could optically calibrate photomask linewidth standards that were narrower than the classical resolution limit of a conventional bright-field

Rectification in Quantum Hall Effect Devices Above Breakdown

March 1, 1999
Author(s)
Kevin C. Lee
Three-terminal contract resistances of 180 contacts on 15 quantum Hall effect (QHE) devices were measured as a function of current at the center of the I = 4 plateau at temperatures between 1.1 K and 1.4 K. For current densities less than about 1.5 A/m

Results and Challenges in Web Search Evaluation

March 1, 1999
Author(s)
D Hawking, Nick Craswell, P Thistlewaite, Donna Harman
A frozen 18.5 million page snapshot of part of the Web has been created to enable and encourage meaningful and reproducible evaluation of Web search systems and techniques. This collection is being used in an evaluation framework within the Text Retrieval
Displaying 50701 - 50725 of 74160
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