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Displaying 50626 - 50650 of 73697

Frustrated Coalescence in a Chemically Reactive Polymer Blend Film

January 1, 1999

Author(s)

Alamgir Karim, Jack F. Douglas, Sushil K. Satija, Charles C. Han, R J. Goyette

FT-IR Based Ellipsometer Using High-Quality Brewster-Angle Polarizers

January 1, 1999

Author(s)

Simon G. Kaplan, Leonard M. Hanssen

Generation of Different UHMWPE Particle Shape by Wear Through Surface Texturing

January 1, 1999

Author(s)

H. W. Fang, M C. Shen, U Cho, John A. Tesk, A Christou, Stephen M. Hsu

Giving a Boost to Atoms

January 1, 1999

Author(s)

Kristian Helmerson

Global Analysis of a-, b- and c-Type Transitions Involving Tunneling Components of K = 0 and 1 States of the Methanol Dimer

January 1, 1999

Author(s)

C Lugez, Francis J. Lovas, Jon T. Hougen, N Ohashi

Spectral data on K = 0 and 1 levels of the methanol dimer available from previous and present Fourier transform microwave measurements have been interpreted globally, using a group-theoretically derived effective Hamiltonian and corresponding tunneling

Global Analysis of a-, b-, c- Type Transitions Involving Tunneling Components of K = 0 and 1 States of the Methanol Dimer

January 1, 1999

Author(s)

C Lugez, Francis J. Lovas, Jon T. Hougen, N Ohashi

Gloss Measurements at NIST

January 1, 1999

Author(s)

Maria E. Nadal, E A. Early, E A. Thompson

Gloss Measurements at NIST

January 1, 1999

Author(s)

Alan K. Thompson, E A. Early, Maria E. Nadal

Goniometric Optical Scatter Instrument for Out-of-Plane Ellipsometry Measurements

January 1, 1999

Author(s)

Thomas A. Germer, Clara C. Asmail

Gray calibration of digital cameras to meet NIST mugshot best practice:

January 1, 1999

Author(s)

Mike Rubinfeld, Charles Wilson

Group Delay Errors Due to Coherent Interference

January 1, 1999

Author(s)

F G. Ascarrunz, Tom Parker, Steven R. Jefferts

GSA guide to specifying interoperable building automation and control systems using ANSIASHRAE Standard 135-1995, BACnet:

January 1, 1999

Author(s)

Steven T Bushby, H Michael Newman, Martin A Applebaum

Guidance to Users of Nycomed-Amersham and North American Scientific 125 I Interstitial Sources: Dosimetry and Calibration Changes: Recommendations of the American Association of Physicists in Medicine Radiation Therapy Committee Ad Hoc Subcommit

January 1, 1999

Author(s)

J F. Williamson, Bert M. Coursey, Larry A. DeWerd, W F. Hanson, Ravinder Nath, Geoffrey S. Ibbott

Guideline for implementing cryptography in the federal government:

January 1, 1999

Author(s)

Annabelle Lee

H out-diffusion and device performance in n-i-p solar cells utilizing high temperature hot wire a-Si:H i-layers, ed. by R. Schropp et al.

January 1, 1999

Author(s)

A H. Mahan, A C. Gallagher

Heat flux transducer calibration::summary of the 2nd workshop

January 1, 1999

Author(s)

William L Grosshandler

HG + Optical frequency Standard: Recent Progress

January 1, 1999

Author(s)

B C. Young, R J. Rafac, J A. Beall, F C. Cruz, Wayne M. Itano, David J. Wineland, James C. Bergquist

High Heat Flux Sensors Calibration in a Cooled Enclosure

January 1, 1999

Author(s)

A V. Murthy, Benjamin K. Tsai, Robert D. Saunders

High Speed Grinding of Silicon Nitride with Electroplated Diamond Wheels, II. Wheel Topography and Grinding Mechanisms

January 1, 1999

Author(s)

T W. Hwang, S Malkin, Christopher J. Evans

This is the second in a series of two papers concerned with high speed grinding of silicon nitride with electroplated diamond wheels. In a companion paper, it was shown that grinding of silicon nitride is accompanied by dulling of the abrasive grains and a

High-Accuracy Aperture-Area Measurement Facilities at the National Institute of Standards and Technology

January 1, 1999

Author(s)

J B. Fowler, R S. Durvaula, Albert C. Parr

High-Density Polyethylene Dosimetry by Transvinylene FTIR Analysis

January 1, 1999

Author(s)

W L. Mclaughlin, J Silverman, M Al-sheikhly, W J. Chappas, Z -. Liu, A Miller, W Batsberg-pedersen

Hydrodynamic Excitations of Trapped Fermi Gases

January 1, 1999

Author(s)

G M. Bruun, Charles W. Clark

Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near Edge Spectroscopy

January 1, 1999

Author(s)

Zachary H. Levine, Bruce D. Ravel

Most integrated circuit interconnects are principally composed of a few metals, including aluminum alloyed with copper, tungsten, titanium, A1 3 Ti, and A1 2Cu, in a silica matrix. Integrated circuit interconnects have recently been proposed as a candidate

Identification of Materials in Integrated Circuit Interconnects Using X-Ray Absorption Near-Edge Spectroscopy

January 1, 1999

Author(s)

Zachary H. Levine, B D. Ravel

Imaging of Surface Wave Slowness

January 1, 1999

Author(s)

D Xiang, Gerald V. Blessing, Nelson N. Hsu

An experimental method has been devised for imaging the acoustic surface wave slowness (inverse of the phase velocity) in anisotropic solids. This technique utilizes a specially designed broadband, line-focus ultrasonic transducer to sense the leaky

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