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Displaying 50526 - 50550 of 73697

Correlated Photon Based Metrology Without Absolute Standards

January 1, 1999
Author(s)
Alan L. Migdall
Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer

Design and Development of a Dictionary Translator

January 1, 1999
Author(s)
John V. Messina, James A. St Pierre, Michael R. McCaleb
The lack of a traceable set of terminologies to describe electronic components has long been identified by the electronic industry as a significant problem. As part of its Electronic Commerce of Component Information (ECCI) project, NIST's Electronic
Displaying 50526 - 50550 of 73697
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