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Displaying 50401 - 50425 of 74164

Telepresence: A New Paradigm for Industrial and Scientific Collaboration

June 1, 1999
Author(s)
Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec
A portion of the mission of the National Institute of Standards and Technology (NIST) Manufacturing Engineering Laboratory (MEL) is to improve and advance length metrology in aid of U.S. industry. The successful development of a Collaboratory for

Telepresence: A New Paradigm for Industrial and Scientific Collaboration

June 1, 1999
Author(s)
Michael T. Postek, Marylyn H. Bennett, N J. Zaluzec
The successful development of a collaboratory for Telepresence Microscopy (TPM) provides an important new tool to promote technology transfer in the areas of measurement technology. NIST and Texas Instruments (TI), under the auspices of the National

The DLMF Project: A New Initiative in Classical Special Functions

June 1, 1999
Author(s)
Daniel W. Lozier
NIST (formerly, National Bureau of Standards) has started an ambitious project that aims to produce a successor to Abramowitz and Stegun's {\em Handbook of Mathematical Functions}, published by the National Bureau of Standards in 1964 and reprinted by

The Fallacy of Monitoring Surge Voltages: SPDs and PCs Galore

June 1, 1999
Author(s)
A. Mansoor, K. O. Phipps, Francois D. Martzloff
To support the recommendation of shifting transient monitoring from voltage surges to current surges, the paper presents experimental results as well as numerical modeling results demonstrating two mechanisms causing an apparent decrease of surge activity

The Infrared Spectra of (NO) + 2 , (NO) - 2 , and (NO) - 3 Trapped in Solid Neon

June 1, 1999
Author(s)
C Lugez, Warren E. Thompson, Marilyn E. Jacox, A Snis, I Panas
New studies of the infrared spectra of the products which result on codeposition at approximately 5 K of a Ne:NO sample with Ne atoms that have been excited in a microwave discharge have led to new and revised assignments for several ionic species. The

Thermal Conductivity of Two Compositions of Yttria-Stabilized Zirconia

June 1, 1999
Author(s)
Andrew J. Slifka, Bernard J. Filla, Judith K. Stalick
The thermal conductivities of two different compositions of yttria-stabilized zirconia have been measured using an absolute, steady-state method. The measurements were made in a one-dised guarded-hot-plate apparatus from 130 C to 950 C. one material has a

Time-Resolved Line Focus Acoustic Microscopy of Composites

June 1, 1999
Author(s)
Nelson N. Hsu
Acoustic microscopy has been used to measure material properties since the 1980s. The velocity of the leaky surface wave can be accurately determined from the V(z) curve which is formed by the interference between the leaky surface wave and specular

Toward Nanometer Accuracy Measurements

June 1, 1999
Author(s)
John A. Kramar, E Amatucci, David E. Gilsinn, Jay S. Jun, William B. Penzes, Fredric Scire, E C. Teague, John S. Villarrubia
We at NIST are building a metrology instrument called the Molecular Measuring Machine (MMM) with the goal of performing 2D point-to-point measurements with one nanometer accuracy cover a 50 mm by 50 mm area. The instrument combines a scanning tunneling

Triangulation-Based L 1 -fitting of Terrain Surfaces

June 1, 1999
Author(s)
Javier Bernal, Christoph J. Witzgall
Given a planar triangulation, the goal is to select elevations at its vertices so that resulting piecewise-linear triangulated surface approximates specified elevations using the L 1-norm as the primary measure-of-fit. Several suboptimal algorithms

Two-Dimensional Calibration Artifact and Measurement Methodology

June 1, 1999
Author(s)
Richard M. Silver, Theodore D. Doiron, William B. Penzes, S Fox, Edward A. Kornegay, S Rathjen, M Takac, D Owen
In this paper, we describe our design and the manufacturing of a two-dimensional grid artifact of chrome on quartz on a 6 inch by 6 inch by .250 glass blank. The design has been agreed upon by a number of SEMI participants working on a two-dimensional

Vacuum Processing Technique for Development of Primary Standard Blackbodies

June 1, 1999
Author(s)
Magdalena Navarro, Sally Bruce, B. Carol Johnson, A V. Murthy, Robert D. Saunders
Blackbody sources with nearly unity emittance that are in equilibrium with a pure freezing metal such as gold, silver, or copper are used as primary standard sources in the International Temperature Scale of 1990 (ITS-90). Recently, a facility using radio

High Accuracy High Speed Gaussian Filter in Surface Metrology

May 31, 1999
Author(s)
Y B. Yuan, Jun-Feng Song, Theodore V. Vorburger
Both (1+x^2)^(-n) and (sin x/x)^n functions are very close to the Gaussian distribution for large value of n. Based on these functions, two new algorithms are developed for designing high accuracy and high speed recursive type Gaussian digital filters. The

Conference Report on the Workshop on Electronic Commerce of Component Information

May 30, 1999
Author(s)
James A. St Pierre, Curtis H. Parks, Bryan C. Waltrip
This report provides an overview of a recent workshop held at NIST in Gaithersburg, July 15-17th on Electronic Commerce of Component Information. The report summarizes the discussions following the workshop's panel sessions and the plans for follow-on work

Update on a Consumer-Oriented Guide for Surge Protection

May 27, 1999
Author(s)
Francois D. Martzloff, T. S. Key, D. Nastasi, K. O. Phipps, J. May
Caught among contradictory stories on the need for surge protection as well as unsupported anecdotes of surge-related failures found in some editorial advertising, the typical consumer is in a quandary on how to est allocate personal resources to protect

Computer Attacks: What They Are and How to Defend Against Them

May 26, 1999
Author(s)
Peter M. Mell
Although a host of technologies exists to detect and prevent attacks against computers, a human must coordinate responding to a successful network penetration. At the same time, the majority of systems administrators are not prepared to handle a

Equating Laboratories: Modelling and Analysis

May 24, 1999
Author(s)
D L. Banks, K Eberhardt
Efficient world trade requires that manufacturers in one country have confidence that their product will meet specifications that are verified by purchasers in another country. But these trading partners rely upon different national metrology laboratories
Displaying 50401 - 50425 of 74164
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