July 9, 2018
Author(s)
Johnathon D. Gard, Daniel T. Becker, Douglas A. Bennett, Joseph W. Fowler, Gene C. Hilton, John A. Mates, Carl D. Reintsema, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom
The readout requirements for instruments based on transition-edge sensors (TESs) have dramatically increased over the last decade as demand for systems with larger arrays and faster sensors has grown. Emerging systems are expected to contain many thousands