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Measurements and identifications of extreme ultraviolet spectra of highly-charged ions of Sm and Er

Published

Author(s)

Yuri A. Podpaly, John D. Gillaspy, Joseph Reader, Yuri Ralchenko

Abstract

We report on the spectroscopic measurements of highly charged samarium and erbium performed at the National Institute of Standards and Technology (NIST) Electron Beam Ion Trap (EBIT). These measurements are in the extreme ultraviolet (EUV) range, and span electron beam energies from 0.98 keV to 3.00 keV. In total, we observed 71 lines from Kr-like Sm^26+ to Ni-like Sm^34+, connecting 83 energy levels, and 64 lines from Rb-like Er^32+ to Ni-like Er^40+, connecting 78 energy levels. Of these lines, 64 lines in Sm and 60 lines in Er are recorded and identified for the first time. All lines are assigned individual uncertainties, most in the ~0.001 nm range. Energy levels are derived from the wavelength measurements.
Citation
Journal of Physics B-Atomic Molecular and Optical Physics
Volume
48
Issue
025002

Keywords

Spectroscopy, highly charged ions, EBIT, extreme ultraviolet

Citation

Podpaly, Y. , Gillaspy, J. , Reader, J. and Ralchenko, Y. (2014), Measurements and identifications of extreme ultraviolet spectra of highly-charged ions of Sm and Er, Journal of Physics B-Atomic Molecular and Optical Physics, [online], https://doi.org/10.1088/0953-4075/48/2/025002 (Accessed April 22, 2021)
Created December 31, 2014, Updated October 9, 2019