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Search Publications

NIST Authors in Bold

Displaying 51 - 75 of 1309

Superconformal Film Growth: From Smoothing Surfaces to Interconnect Technology

April 20, 2023
Author(s)
Thomas P. Moffat, Trevor Braun, David Raciti, Daniel Josell
CONSPECTUS: State-of-the-art manufacturing of electronics involves the electrodeposition of Cu to form 3-D circuitry of arbitrary complexity. This ranges from nanometers wide interconnects between individual transistors to increasingly large multilevel

Comparison of saturator designs for low volatility liquid precursor delivery

April 1, 2023
Author(s)
James E. Maslar, William A. Kimes, Vladimir B. Khromchenko, Brent Sperling, Ravindra Kanjolia
Low volatility precursors are widely utilized in chemical vapor deposition and atomic layer deposition processes. Such precursors are often delivered from one of two common saturator designs: a bubbler or a flow over vessel. Previous reports concerning

Multiscale Green's functions for modeling graphene and other Xenes

January 27, 2023
Author(s)
Vinod Tewary, Edward Garboczi
We give a review of the multiscale Green's function method for modeling modern two-dimensional nanomaterials such as graphene and other Xenes. The method is applicable to materials at different space and time scales and is computationally efficient. This

On-Wafer Vector-Network-Analyzer Measurements at mK Temperatures

January 11, 2023
Author(s)
Elyse McEntee Wei, Richard Chamberlin, Nate Kilmer, Joshua Kast, Jake A. Connors, Dylan Williams
We describe a system for performing on-wafer vector-network-analyzer measurements from 100 MHz to 15 GHz at mK temperatures (i.e., less than 20 mK). We first demonstrate a camera-less probe positioning system and calibrate this system at 4.4 K. We then use

Symmetry-dependent ultrafast manipulation of nanoscale magnetic domains

December 23, 2022
Author(s)
Nanna Hagstrom, Rahul Jangid, F. N. U. Meera, Diego Turenne, Jeffrey Brock, Erik Lamb, Boyan Stoychev, Justine Schlappa, Natalia Gerasimova, Benjamin Van Kuiken, Rafael Gort, Laurent Mercadier, Loic Le Guyader, Andrey Samartsev, Andreas Scherz, Giuseppe Mercurio, Hermann Durr, Alexander Reid, Monika Arora, Hans Nembach, Justin Shaw, Emmanuelle Jal, Eric Fullerton, Mark Keller, Roopali Kukreja, Stefano Bonetti, Thomas J. Silva, Ezio Iacocca
Symmetry is a powerful concept in physics, but its applicability to far-from-equilibrium states is still being understood. Recent attention has focused on how far-from-equilibrium states lead to spontaneous symmetry breaking. Conversely, ultrafast optical

Intelligent-Fabric Computing: Challenges and Opportunities

November 8, 2022
Author(s)
Min Chen, Jia Liu, Pan Li, Hamid Gharavi, Yixue Hao, Jingyu Ouyang, Long Hu, Chong Hou, Iztok Humar, Lei Wei, Guang-Zhong Yang, Guangming Tao
With the advent of the Internet of Everything, people can easily interact with their environments immersively. The idea of pervasive computing is becoming a reality, but due to the inconvenience of carrying silicon-based entities and a lack of fine-grained

Demonstration of Superconducting Optoelectronic Single-Photon Synapses

October 6, 2022
Author(s)
Saeed Khan, Bryce Primavera, Jeff Chiles, Adam McCaughan, Sonia Buckley, Alexander Tait, Adriana Lita, John Biesecker, Anna Fox, David Olaya, Richard Mirin, Sae Woo Nam, Jeff Shainline
Superconducting optoelectronic hardware is being explored as a path towards artificial spiking neural networks with unprecedented scales of complexity and computational ability. Such hardware combines integrated-photonic components for few-photon, light

Towards the Physical Reliability of 3D-Integrated Systems: Broadband Dielectric Spectroscopic (BDS) Studies of Material Evolution and Reliability in Integrated Systems

September 30, 2022
Author(s)
Papa Amoah, Joseph J. Kopanski, Yaw S. Obeng, Christopher Sunday, Chukwudi Okoro, Lin You, Dmirty Veksler
In this paper, we present an overview of our current research focus in developing non-destructive metrology for monitoring reliability issues in 3D-integrated electronic systems. We introduce a suite of non-destructive metrologies that can serve as early
Displaying 51 - 75 of 1309