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NIST Authors in Bold

Displaying 49776 - 49800 of 74105

Measurement of P-Wave Threshold Law Using Evaporatively Cooled Fermionic Atoms

May 1, 1999
Author(s)
B. L. DeMarco, J L. Bohn, J P. Burke, M J. Holland, Deborah S. Jin
We have measured independently both s-wave and p-wave cross-dimensional thermalization rates for ultracold 40K atoms held in a magnetic trap. These measurements reveal that this fermionic isotope has a large positive s-wave triplet scattering length in

Measurements and Predictions of Light Scattering by Coatings

May 1, 1999
Author(s)
Theodore V. Vorburger, Egon Marx, M E. McKnight, Maria Nadal, P Y. Barnes, Alan Keith Thompson, Michael Galler, Fern Y. Hunt, Mark R. VanLandingham
We show comparisons between calculations and measurements of angle-resolved light scattering distributions from clear dielectric, isotropic coatings. The calculated distributions are derived from topography measurements performed with scanning white light

Migdall Responds

May 1, 1999
Author(s)
Alan L. Migdall
I thank Duane Jaecks for pointing out earlier origins of the first of the correlated photon metrology applications described in my article - absolute detector quantum efficiency. The work in these early references is helpful in putting the technique in a

Modelling Service Life and Life-Cycle Cost of Steel-Reinforced Concrete

May 1, 1999
Author(s)
G J. Frohnsdorff
The NIST / ACI / ASTM Workshop on Modelling Service Life and Life-Cycle Cost of Steel-Reinforced Concrete was focused on possibilities for developing and standardizing such models, specifically for concrete exposed to chlorides. The report includes

Patterning of Octadecylsiloxane Self-assembled Monolayers on Si(100) using Ar( 3 P 0 ,2) Atoms

May 1, 1999
Author(s)
Shannon B. Hill, C Haich, F Dunning, G Walters, Jabez J. McClelland, Robert Celotta, H Craighead, J Han, D Tannenbaum
We report the use of metastable (Ar 3P 0,2) atoms and a physical mask to pattern octadecylsiloxane self-assembled monolayers grown directly onsilicon surfaces. The damage to the monolayer is confirmed using lateral force microscopy, changes in

Relating Thermoplastic Olefin (TPO) Microstructure to Paint Adhesion

May 1, 1999
Author(s)
Mark R. VanLandingham
Advances in the use of the atomic force microscope (AFM) to characterize polymeric materials have recently been made. Phase imaging with the AFM has emerged as a powerful technique, providing contrast enhancement of topographic features and, in some cases

Semiconductor Device Temperature Measurements Using Electrical Parameters

May 1, 1999
Author(s)
David L. Blackburn
The purpose of this paper is to describe the use of semiconductor device electrical parameters for measuring the temperature of a device. Included are discussions of the material and device parameters used as thermometers and an examination of the accuracy

SIMnet - a Collaborative Tool for Metrology in the Americas

May 1, 1999
Author(s)
Piotr S. Filipski, Nile M. Oldham
The use of video conferencing equipment used with the Internet to facilitate international comparisons and collaborations is described. The system employs standard hardware and software at a number of National Metrology Institutes within the Americas and a
Displaying 49776 - 49800 of 74105