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NIST Programs for Calibrations in the Far Ultraviolet Spectral Region

Published

Author(s)

Robert E. Vest, L R. Canfield, Mitchell L. Furst, R M. Graves, A D. Hamilton, L R. Hughey, Thomas B. Lucatorto, R P. Madden

Abstract

The National Institute of Standards and Technology (NIST) serves the growing ultraviolet user community by providing calibration services throughout the spectral range from 2 nm to 400 nm. In this paper we describe the far ultraviolet transfer standard detector program, the NASA-supported Spectrometer Calibration Beamline at the Synchrotron Ultraviolet Radiation Facility, SURF III, and the recent upgrade of the SURF electron storage ring. Several types of transfer standard detectors are issued by NIST in the spectral range from 5 nm to 254 nm: Al2O3 windowless photoemissive devices, CsTe photoemissive devices with integrated MgF2 windows, and radiation-hardened, semiconductive Si photodiodes. The Spectrometer Calibration Beamline makes use of the calculable, undispersed synchrotron radiation from SURF III as a standard of spectral irradiance from 2 nm to 400 nm. The upgrade of SURF has greatly improved the accuracy of calibrations based on SURF, as well as extending the useful spectral range to shorter wavelengths. Taken together, the transfer standard detector program and the calibration beamline at SURF III offer a unique calibration resource for scientists and engineers working in the far ultraviolet spectral region.
Proceedings Title
Proceedings of the 44th annual SPIE meeting
Conference Dates
July 22-23, 1999
Conference Title
SPIE Meeting

Keywords

calibrations, deep ultraviolet, detector, extreme ultraviolet, far ultraviolet, photodiode, radiometry, synchrotron radiation, transfer standard

Citation

Vest, R. , Canfield, L. , Furst, M. , Graves, R. , Hamilton, A. , Hughey, L. , Lucatorto, T. and Madden, R. (1999), NIST Programs for Calibrations in the Far Ultraviolet Spectral Region, Proceedings of the 44th annual SPIE meeting (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 1999, Updated February 17, 2017