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Displaying 49326 - 49350 of 143775

Reverberation-Chamber Test Environment for Outdoor Urban Wireless Propagation Studies

June 21, 2010
Author(s)
Helge Fielitz, Kate Remley, Christopher L. Holloway, Qian Zhang, Qiong Wu, David W. Matolak
We introduce a test environment to replicate the well-known clustering of reflections in power delay profiles from urban wireless propagation environments that exhibit late-time delays and reflections. The test set-up combines discrete reflections

Visual Similarity based 3D Shape Retrieval Using Bag-of-Features

June 21, 2010
Author(s)
Zhouhui Lian, Afzal A. Godil, Xianfang Sun
This paper develops a novel 3D shape retrieval method, which uses Bag-of-Features and an efficient multi-view shape matching scheme. In our approach, a properly normalized object is first described by a set of depth-buffer views captured on the surrounding

Application of Microwave Scanning Probes to Photovoltaic Materials

June 20, 2010
Author(s)
Kristine A. Bertness, John B. Schlager, Norman A. Sanford, Atif A. Imtiaz, Thomas M. Wallis, Joel C. Weber, Pavel Kabos, Lorelle M. Mansfield
We demonstrate that near field scanning microwave microscopy (NSMM) can be used to detect photoresponse in photovoltaic materials with potential for submicrometer resolution. In this approach, a radio-frequency scanning tunneling microscopy (RF-STM) tip is

Method to determine the absorbance of thin films for photovoltaic technology

June 20, 2010
Author(s)
Nathan A. Tomlin, John H. Lehman, Katherine E. Hurst, D. B. Tanner, K. Kamaras, Aron Pekker
We have demonstrated a novel method to determine optical properties of opaque or semi-transparent films for photovoltaic (PV) applications. Such films may be the basis of transparent conductors or photoconductive material. As an example, we measure the

Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis

June 20, 2010
Author(s)
Elisabeth Mansfield, Aparna Kar, Stephanie A. Hooker
A new method for analyzing the chemical purity and consistency of microscale samples is described using a quartz crystal microbalance (QCM) sensor platform. The QCM is used to monitor sub-picogram changes in the mass of a deposited thin film as a function

Space charge limited current effects in silicon at high injection levels

June 20, 2010
Author(s)
Ari D. Feldman, Richard K. Ahrenkiel
The space charge limited current (SCLC) effect will be analyzed in undoped crystalline silicon wafers at high injection levels. Space charge limited currents develop when the electric field from the injected carriers exceeds that of the background doping

Behavior of e (omega} and tan d of a Class of Low-Loss Materials

June 18, 2010
Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle, Kim Sung
In this project we study the behavior of the permittivity and loss tangent of a class of materials that exhibit relaxation. For relaxation response we show that the permittivity is a monotonically decreasing function of frequency. Also, for many low-liss

On interchangeability of two laboratories

June 18, 2010
Author(s)
Chih-Ming Wang, Hariharan K. Iyer
This paper proposes a measure for assessing the degree of equivalence between the two laboratories in a key comparison. The measure is called asymmetric degree of interchangeability. It is asymmetric since, based on this measure, a laboratory may be

Simulator for Amplifier and Transistor Noise-Parameter Measurements

June 18, 2010
Author(s)
James P. Randa
This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both
Displaying 49326 - 49350 of 143775
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