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Displaying 48626 - 48650 of 74696

Comparison of Electrical CD Measurements and Cross-Section Lattice-Plane Counts of Sub-Micrometer Features Replicated in (100) Silicon-on-Insulator Material

June 1, 2000
Author(s)
Michael W. Cresswell, John E. Bonevich, T J. Headley, Richard A. Allen, Lucille A. Giannuzzi, Sarah C. Everist, Rathindra Ghoshtagore, Patrick J. Shea
Test structures of the type known as cross-bridge resistors have been patterned in (100) epitaxial silicon material that was seeded on Bonded and Etched-Back silicon-on-Insulator (BESOI) substrates. The electrical CDs (Critical Dimensions) of a limited

Controller Driven VRML Animation of a Real-Time Inspection System

June 1, 2000
Author(s)
Keith A. Stouffer, John A. Horst
Virtual objects in a web-based environment can be interfaced to and controlled by external real world controllers. A Virtual Reality Modeling Language (VRML) inspection cell was created that models a realtime inspection system The inspection system

Convective and Morphological Instabilities During Crystal Growth

June 1, 2000
Author(s)
Sam R. Coriell, Geoffrey B. McFadden, B T. Murray
We have studied the effects of interface morphology on the dynamics of dendritic growth. The Ivantsov solution for an isothermal paraboloid of revolution growing into a pure, supercooled melt provides a relation between the bulk supercooling and a

Coplanar-Waveguide-to-Microstrip Transition Model

June 1, 2000
Author(s)
Wojciech Wiatr, Dave K. Walker, Dylan Williams
We develop a novel four-port equivalent circuit for a coplanar-waveguide-to-microstrip transition using a finite-difference time-domain analysis. The lumped model accounts for mutual inductive coupling and works well up to about 30 GHz.

Correlation of the optical gap of (Ba,Sr)yTiO 2+y thin films with film composition

June 1, 2000
Author(s)
L D. Rotter, Mark D. Vaudin, John E. Bonevich, Debra L. Kaiser, S 0. Park
A series of (Ba 1-x,Sr x)yTiO 2+y films with a wide range of y and x < 0.07 was grown by metalorganic chemical vapor deposition. The composition of the films was determined by wavelength dispersive x-ray spectrometry. Transmission spectra were measured and

Critical Issues in the Characterization of Polymers for Medical Applications

June 1, 2000
Author(s)
Walter G. McDonough, Eric J. Amis, J Kohn
On June 14, 2000, the New Jersey Center for Biomaterials and the Polymers Division of the National Institute of Standards and Technology (NIST) co-sponsored a one-day workshop on Critical Issues in the Characterization of Polymers for Medical Applications
Displaying 48626 - 48650 of 74696
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