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Dynamic Input Capacitance of Single-Electron Transistors and the Effect on Charge-Sensitive Electrometers

Published

Author(s)

Neil M. Zimmerman, Mark W. Keller
Citation
Journal of Applied Physics
Volume
87
Issue
12

Keywords

charge sensitive electrometer, input capacitance, single electron tunneling

Citation

Zimmerman, N. and Keller, M. (2000), Dynamic Input Capacitance of Single-Electron Transistors and the Effect on Charge-Sensitive Electrometers, Journal of Applied Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=4031 (Accessed June 13, 2024)

Issues

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Created May 31, 2000, Updated October 12, 2021