TY  - JOUR
AU  - Zimmerman, Neil
AU  - Keller, Mark
C2  - Journal of Applied Physics
DA  - 2000-06-01 00:06:00
LA  - en
M1  - 87
PB  - Journal of Applied Physics
PY  - 2000
TI  - Dynamic Input Capacitance of Single-Electron Transistors and the Effect on Charge-Sensitive Electrometers
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=4031
ER  -