NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 48526 - 48550 of 73697

Flammability of Polystyrene-Clay Nanocomposites

January 1, 2000
Author(s)
A B. Morgan, Jeffrey W. Gilman, Richard H. Harris Jr., C L. Jackson, C A. Wilkie, J Zhu
Research in the area of condensed phase flame retardants for polymers usually builds upon existing technologies, such as metal hydroxides (alumina, magnesium hydroxide) or phosphorus based materials. However, these materials tend to weaken mechanical

Flits: Pervasive Computing for Processor and Memory Constrained Systems

January 1, 2000
Author(s)
William J. Majurski, Alden A. Dima, Mary T. Laamanen
Many pervasive computing software technologies are targeted for 32-bit desktop platforms. However, there are innumerable 8, 16, and 32-bit microcontroller and microprocessor-based embedded systems that do not support the resource requirements of these

Force Metrology at NIST

January 1, 2000
Author(s)
Simone L. Yaniv, Thomas W. Bartel
This paper describes the measurements services, the instrumentation and procedures available for force metrology at the National Institute of Standards and Technology, USA. The uncertainty of the voltage ratio indicating system for strain gage load cells

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000
Author(s)
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their

Generating Solitons by Phase Engineering of a Bose-Einstein Condensate

January 1, 2000
Author(s)
J Denschlag, J E. Simsarian, D L. Feder, Charles W. Clark, L A. Collins, J Cubizolles, Lu Deng, Edward W. Hagley, Kristian Helmerson, W P. Reinhardt, S L. Rolston, B I. Schneider, William D. Phillips
We demonstrate quantum phase engineering using two novel techniques that allow us to write and read the spatial phase of a Bose-Einstein condensate (BEC). We design and produce a quantum state by optically imprinting phasepatterns onto a condensate of

Growth & Magnetic Oscillatory Exchange Coupling of Mn/Fe (001) and Fe/Mn/Fe (001)

January 1, 2000
Author(s)
D Tulchinsky, John Unguris, Robert Celotta
The magnetic ordering and the interlayer exchange coupling in Mn and Fe/Mn wedge structures grown epitaxially on Fe(001) whisker substrates were investigated using scanning electron microscopy with polarization analysis (SEMPA). In bare Mn/Fe(001) samples

H. H. Ku, 1918-1999

January 1, 2000
Author(s)
C M. Croarkin, Joan R. Rosenblatt
A short obituary article on Hsien Hsiang (Harry) Ku, former Chief of the Statistical Engineering Division at the National Institute of Standards and Technology (NIST), who died of cancer on June 4, 1999, at his home in Kensington, MD.
Displaying 48526 - 48550 of 73697
Was this page helpful?