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The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic



S. Avramov, Andrew D. Koffman, Nile M. Oldham, Bryan C. Waltrip


A joint effort between the U.S. Naval Academy and the National Institute of Standard and Technology (NIST) resulted in the development of a method to characterize the capacitance and dissipation factor of a set of commercial standard four terminal-pair (4TP) capacitors. The method depends on network analyzer impedance measurements at high frequencies (40 MH-200 MHz) and a regression of these measurements down to the frequency range of 10 MHz-1 kHz. This paper provides an analysis of the sensivitivity of the refression parameters and the high-frequency impedance measurements.
IEEE Transactions on Instrumentation and Measurement


capacitance, capacitance characterization, capacitance prediction, dissipation factor, four-terminal pair, frequency measurement range, network, analyzer prediction, regression parameters


Avramov, S. , Koffman, A. , Oldham, N. and Waltrip, B. (2000), The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic, IEEE Transactions on Instrumentation and Measurement, [online], (Accessed April 15, 2024)
Created March 31, 2000, Updated October 12, 2021