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The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic

Published

Author(s)

S. Avramov, Andrew D. Koffman, Nile M. Oldham, Bryan C. Waltrip

Abstract

A joint effort between the U.S. Naval Academy and the National Institute of Standard and Technology (NIST) resulted in the development of a method to characterize the capacitance and dissipation factor of a set of commercial standard four terminal-pair (4TP) capacitors. The method depends on network analyzer impedance measurements at high frequencies (40 MH-200 MHz) and a regression of these measurements down to the frequency range of 10 MHz-1 kHz. This paper provides an analysis of the sensivitivity of the refression parameters and the high-frequency impedance measurements.
Citation
IEEE Transactions on Instrumentation and Measurement
Volume
49
Issue
2

Keywords

capacitance, capacitance characterization, capacitance prediction, dissipation factor, four-terminal pair, frequency measurement range, network, analyzer prediction, regression parameters

Citation

Avramov, S. , Koffman, A. , Oldham, N. and Waltrip, B. (2000), The Sensitivity of a Method to Predict a Capacitor's Frequency Characteristic, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=16695 (Accessed December 14, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created March 31, 2000, Updated October 12, 2021