Wu, C.
(2000),
Sub-Nanosecond Lifetime Measurement Using the Recoil-Distance Method, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed May 11, 2025)
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Sub-Nanosecond Lifetime Measurement Using the Recoil-Distance Method
Published
Author(s)
C Y. Wu
Citation
Journal of Research (NIST JRES) -
Volume
105 No. 1
NIST Pub Series
Pub Type
NIST Pubs
Keywords
lifetime measurements, low-lying states, recoil-distance method
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 1, 2000, Updated February 17, 2017