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Sub-Nanosecond Lifetime Measurement Using the Recoil-Distance Method

Published

Author(s)

C Y. Wu
Citation
Journal of Research (NIST JRES) -
Volume
105 No. 1

Keywords

lifetime measurements, low-lying states, recoil-distance method

Citation

Wu, C. (2000), Sub-Nanosecond Lifetime Measurement Using the Recoil-Distance Method, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 29, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created April 1, 2000, Updated February 17, 2017