Gillaspy, J.
(2000),
Trapping Highly Charged Ions: Fundamentals and Applications, Nova Publisher, Hauppauge, NY (Accessed May 8, 2026)
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Trapping Highly Charged Ions: Fundamentals and Applications
Published
Author(s)
Abstract
Fundamentals and applications for trapping highly charged ions.Citation
Trapping Highly Charged Ions: Fundamentals and Applications
Publisher Info
Nova Publisher, Hauppauge, NY
Pub Type
Books
Keywords
atoms, EBIT, electron beam ion trap, highly charged atoms
Citation
Issues
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Created April 1, 2000, Updated February 19, 2017