Gillaspy, J.
(2000),
Trapping Highly Charged Ions: Fundamentals and Applications, Nova Publisher, Hauppauge, NY
(Accessed December 11, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Trapping Highly Charged Ions: Fundamentals and Applications
Published
Author(s)
Abstract
Fundamentals and applications for trapping highly charged ions.Citation
Trapping Highly Charged Ions: Fundamentals and Applications
Publisher Info
Nova Publisher, Hauppauge, NY
Pub Type
Books
Keywords
atoms, EBIT, electron beam ion trap, highly charged atoms
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 1, 2000, Updated February 19, 2017