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Trapping Highly Charged Ions: Fundamentals and Applications

Published

Author(s)

John D. Gillaspy

Abstract

Fundamentals and applications for trapping highly charged ions.
Citation
Trapping Highly Charged Ions: Fundamentals and Applications
Publisher Info
Nova Publisher, Hauppauge, NY

Keywords

atoms, EBIT, electron beam ion trap, highly charged atoms

Citation

Gillaspy, J. (2000), Trapping Highly Charged Ions: Fundamentals and Applications, Nova Publisher, Hauppauge, NY (Accessed June 24, 2024)

Issues

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Created April 1, 2000, Updated February 19, 2017