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NIST Authors in Bold

Displaying 47501 - 47525 of 73697

Enterprise Resource Planning Systems in Manufacturing

July 1, 2000
Author(s)
Edward J. Barkmeyer Jr., Mary B. Algeo
Enterprise resource planning (ERP) systems are commercial applications that provide the backbone necessary to support the enterprise-wide integration of processes and information required for day-to-day operations as well as for tactical level planning of

Evaluating Evaluation Measure Stability

July 1, 2000
Author(s)
C E. Buckley, Ellen M. Voorhees
This paper presents a novel way of examining the accuracy of the evaluation measures commonly used in information retrieval experiments. It validates several of the rules-of-thumb experimenters use, such as the number of queries needed for a good

Evaluation of Standards for a 10 V MAP Service at NIST

July 1, 2000
Author(s)
Yi-hua D. Tang, June E. Sims
A Measurement Assurance Program (MAP) provides a method of assessing and maintaining the quality of a measurement process. Such a program has two parts: the operation of a set of statistical tools to ensure the predictable behavior of the standards and

Experimental Tests of Atomic Structure Calculations

July 1, 2000
Author(s)
Wolfgang L. Wiese
Emission experiments, performed at NIST and the Ruhr University, have provided sensitive tests of recent atomic structure calculations. Somewhat surprisingly, numerous large discrepancies have been found between experiment and theory, and also between

Fast Imaging of Hard X-Rays With a Laboratory Microscope

July 1, 2000
Author(s)
A S. Bakulin, S M. Durbin, Terrence J. Jach, J Pedulla
An improved x-ray microscope with a fully electronic CCD detector system has been constructed that allows improved laboratory-based microstructural investigations of materials with hard x-rays. It uses the Kirkpatrick-Baez multilayer mirror design to form

Flammability of Polymer Clay Nanocomposites Consortium: Year One Annual Report (NISTIR 6531)

July 1, 2000
Author(s)
Jeffrey W. Gilman, Takashi Kashiwagi, A B. Morgan, Richard H. Harris Jr., L D. Brassell, Mark R. VanLandingham, C L. Jackson
We recently found that polymer layered-silicate (clay) nanocomposites have the unique combination of reduced flammability and improved physical properties. However, the details of the fire retardant mechanism were not well understood. In October of 1998 a

Fracture and the Structure of Silica

July 1, 2000
Author(s)
Stephen W. Freiman
Not only because of its historic and widespread use in applications where its strength and brittle nature are significant factors, but also because it is homogeneous in composition and structure, and isotropic in its properties, glass is an ideal medium in

Identification of Parameters in Multilayer Media

July 1, 2000
Author(s)
Edward Della Torre, R A. Fry, O Alejos, E Cardelli
Multilayer media are of increasing importance as magneto-optic and perpendicular media. The properties of successive layers evolve as the layers are epitaxially deposited. This complicates both the model for these media and the identification of the model

Identifying Critical Patches With ICAT

July 1, 2000
Author(s)
Peter M. Mell
[For the latest information on vulnerabilities, see the National Vulnerability Database, nvd.nist.gov]The NIST computer security division has created a searchable index containing 700 of the most important computer vulnerabilities. This index, called the

Improving the Accuracy of Particle Analysis

July 1, 2000
Author(s)
John A. Small, J R. Michael, Dale E. Newbury
Historically the procedures for the quantitative X-ray analysis of particles in the electron probe have been similar to the methods used for bulk electron probe samples.The main difference was that corrections had to be made to the experimental k-ratios or

Information Technology for Engineering and Manufacturing

July 1, 2000
Author(s)
James E. Fowler, Mark G. Carlisle
This paper summarizes material presented at Information Technology for Engineering & Manufacturing, a conference organized by NIST's Systems Integration for Manufacturing Applications (SIMA) program office to examine problems facing manufacturers as they

Integration of Manufacturing Simulations Using High Level Architecture (HLA)

July 1, 2000
Author(s)
Charles R. McLean, Swee K. Leong, Frank H. Riddick
This paper presents an overview of a neutral reference architecture for integrating distributed manufacturing simulation systems with each other, with other manufacturing software applications, and with manufacturing data repositories. Other manufacturing
Displaying 47501 - 47525 of 73697
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