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Displaying 46826 - 46850 of 74171

Materials Reliability Division FY 2000 Programs and Accomplishments

January 1, 2001
Author(s)
F R. Fickett
The technical activities of the Materials Reliability Division during fiscal year 2000 are summarized. The Division has 23 research projects in the following eight program areas: Materials for Microelectronics (4): Materials for Wireless Communication (5)

Mathematics and Measurement

January 1, 2001
Author(s)
Ronald F. Boisvert, Michael J. Donahue, Daniel W. Lozier, Robert D. McMichael, Bert W. Rust
In this paper we describe the role that mathematics plays in measurement science at NIST. We first survey the history behind NIST's current work in this area, starting with the NBS Math Tables project of the 1930s. We then provide examples of more recent

Measurement Considerations for the Determination of Central Plant Efficiency

January 1, 2001
Author(s)
Stephen J. Treado, Todd W. Snouffer
Concerns about maintaining optimum operating conditions for central plants in order to minimize energy usage and cost have highlighted the need for accurate measruements of electrical power, fluid flow and temperature chillers and boilers. In particular

Measurements of Static Noise in Display Images

January 1, 2001
Author(s)
John W. Roberts, Edward F. Kelley
The appearance of noise on a display is an important usability issue. Sources of noise include electrical interference, display driver artifacts, resampling artifacts, transmission artifacts, compression artifacts, and any intrinsic noise artifacts

Metallurgy Division 2000 Programs and Accomplishments

January 1, 2001
Author(s)
C A. Handwerker, Robert J. Schaefer
This report describes major programs and accomplishments of the Metallurgy Division of the NIST Materials Science and Engineering Laboratory (MSEL) in FY2000.The mission of the NIST Metallurgy Division is to provide critical leadership in the development

Method of Measuring Shunt Resistance of Photodiodes

January 1, 2001
Author(s)
P R. Thompson, Thomas C. Larason
A method of measuring the shunt resistance of diodes, specifically photodiodes, is examined and the procedure of how the method is implemented using LabVIEW is detailed. Rudimentary comparison with other accepted methods in industry is done. The

Microcalorimeter/EBIT Measurements of X-Ray Spectra of Highly Charged Ions

January 1, 2001
Author(s)
I Kink, J M. Laming, E Takacs, James V. Porto, John D. Gillaspy, E Silver, H. Schnopper, Simon R. Bandler, M Barbera, N Brickhouse, S Murray, D Landis, J. Beeman, E. E. Haller
Spectra of highly charged Ar, Kr, Xe and Fe ions, produced in an Electron Beam Ion Trap (EBIT), have been recorded in a broad x-ray energy band (0.2 keV to 10 keV) with a microcalorimeter detector. The first analysis of the Kr spectra has been completed
Displaying 46826 - 46850 of 74171
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