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Method of Measuring Shunt Resistance of Photodiodes

Published

Author(s)

P R. Thompson, Thomas C. Larason

Abstract

A method of measuring the shunt resistance of diodes, specifically photodiodes, is examined and the procedure of how the method is implemented using LabVIEW is detailed. Rudimentary comparison with other accepted methods in industry is done. The uncertainty analysis of the measurements using the specified method is given .
Proceedings Title
2001 Measurement Science Conference
Volume
CD-ROM
Conference Dates
January 18-19, 2001
Conference Location
Undefined
Conference Title
Measurement Science Conference

Keywords

diode, measurement, photodiode, shunt resistance, uncertainty

Citation

Thompson, P. and Larason, T. (2001), Method of Measuring Shunt Resistance of Photodiodes, 2001 Measurement Science Conference, Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841525 (Accessed June 19, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 31, 2000, Updated October 12, 2021