Thompson, P.
and Larason, T.
(2001),
Method of Measuring Shunt Resistance of Photodiodes, 2001 Measurement Science Conference, Undefined, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=841525
(Accessed May 18, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Method of Measuring Shunt Resistance of Photodiodes
Published
Author(s)
P R. Thompson,
Abstract
A method of measuring the shunt resistance of diodes, specifically photodiodes, is examined and the procedure of how the method is implemented using LabVIEW is detailed. Rudimentary comparison with other accepted methods in industry is done. The uncertainty analysis of the measurements using the specified method is given .Proceedings Title
2001 Measurement Science Conference
Volume
CD-ROM
Conference Dates
January 18-19, 2001
Conference Location
Undefined
Conference Title
Measurement Science Conference
Pub Type
Conferences
Download Paper
Keywords
diode, measurement, photodiode, shunt resistance, uncertainty
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 31, 2000, Updated October 12, 2021