U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 45226 - 45250 of 73960

Ca 4 Nb 2 0 9 -CaTi0 3 : Phase Equilibria and Microstructures

August 1, 2001
Author(s)
Leonid A. Bendersky, Igor Levin, Robert S. Roth, Alexander J. Shapiro
Ca 4TiO 3-Ca 4Nb 2O 9 is a quasi-binary section, and all the phases participating in equilibrium are solid solutions of the binary end-members. The phases are perovskite-based ABO3-type, with a common stoichiometry Ca[Ca (1-x)/(3-2x)Nb (2-2x)/ (3-2x)Ti x/

Characterization of Thin and Ultrathin Polymer and Resist Films

August 1, 2001
Author(s)
D L. Goldfarb, Q Lin, M Angelopoulos, Christopher Soles, Eric K. Lin, Wen-Li Wu
The need for a better understanding of the physicochemical properties of radiation-sensitive thin polymer coatings for lithographic applications is driven by the trend of ever-shrinking pattern dimensions and film thickness, imposed by the semiconductor

Combinatorial Investigations of Polymer Adhesion

August 1, 2001
Author(s)
A J. Crosby, Alamgir Karim, Eric J. Amis
Combinatorial measurement methods allow material properties to be investigated in a multivariable space. These techniques could be especially attractive for investigating polymer adhesion that is determined by the complex coupling of bulk and interfacial

Comparison of Edge Detection Methods Using a Prototype Overlay Calibration Artifact

August 1, 2001
Author(s)
Richard M. Silver, Jay S. Jun, Edward A. Kornegay, R Morton
Accurate overlay measurements rely on robust, repeatable, and accurate feature position determination. In our effort to develop traceable we have examined a number of and the parameters which affect those measurements. The samples used in this study are a

Comparison of Two Cryogenic Radiometers at NIST

August 1, 2001
Author(s)
Jeanne M. Houston, David J. Livigni
Two cryogenic radiometers from NIST, one from the Optical Technology Division and the other from the Optoelectronics Division, were compared at three visible laser wavelengths. For this comparison each radiometer calibrated two photodiode trap detectors

Definitions of the Units Radian, Neper, Bel, and Decibel

August 1, 2001
Author(s)
I M. Mills, Barry Taylor, A J. Thor
The definition of coherent derived units in the International System of Units (SI) is reviewed, and the important role of the equations defining physical quantities is emphasized in obtaining coherent derived units. In the case of the dimensionless

Design of an Active MM-Wave Concealed Object Imaging System

August 1, 2001
Author(s)
Nicholas Paulter, Erich N. Grossman, Gerard N. Stenbakken, Bryan C. Waltrip, Shalva Nolen, Carl D. Reintsema
The research and design of an active millimeter-wave concealed object imaging system is described. Several illumination and detection methods were analyzed via computer simulation to assess the effects of system parameters on the signal-to-noise ratio of

Domain-Engineered Thin-Film LiNbO 3 Pyroelectric-Bicell Optical Detector

August 1, 2001
Author(s)
John H. Lehman, A. M. Radojevic, R M. Osgood
We have fabricated a bicell detector consisting of a single freestanding 10 um thick film of single-crystal lithium niobate (LiNbO3), having two adjacent domains of opposite spontaneous polarization, and hence two adjacent pyroelectric detector regions of

Early Stage Crystallization in Poly (Ethylene-Co-Hexene) by SAXS/WAXD, DSC, OM and AFM

August 1, 2001
Author(s)
G Z. Wang, Haonan Wang, K Shimizu, Charles C. Han, B S. Hsiao
Isothermal crystallization in the early stages of one short-chain branching polyethylene, PEH, is examined by time-resolved SAXS/WAXD, DSC, optical microscope and AFM. WAXD showed a rapid decrease of the inter-chain distance in the amorphous phase at the

Edge Determination for Polycrystalline Silicon Lines on Gate Oxide

August 1, 2001
Author(s)
John S. Villarrubia, Andras Vladar, J R. Lowney, Michael T. Postek
In a scanning electron microscope (SEM) top-down secondary electron image, areas within a few tens of nanometers of the line edges arc characteristically brighter than the rest of the image. In general, the shape of the secondary electron signal within

Electric Force Microscopy with a Single Carbon Nanotube Tip

August 1, 2001
Author(s)
John A. Dagata, F S. Chien, S Gwo, K Morimoto, T Inoue, J Itoh, H Yokoyama
Carbon nanotube tips offer a significant improvement over standard scanned probe microscope (SPM) tips for electrical characterization of nanodevice structures. Carbon nanotube tips are compatible with requirements for integrated SPM probe station
Displaying 45226 - 45250 of 73960
Was this page helpful?