Multispectral Probes for Materials and Chemical Analysis
Steven A. Buntin
High throughput experimentation is currently restricted by its limited ability to evaluate more than one parameter of a library at a time (e.g., chemical composition, dielectric constant, refractive index, surface roughness, phase , luminescence). When compared to the highly parallel synthetic strategies used to generate combinatorial libraries, the serial screening processes may ultimately limit the obtainable throughput of a combinatorial method. With the ability to rapidly prepare complex libraries to support a broad range of performance attributes, it will become increasingly valuable to be able to collect performance and compositional information simultaneously thereby gaining a multiplex/multichannel advantage. To this end, NIST is developing measurement platforms that exploit non-contact, multi-tasked microscopies and spectroscopies. Our work focuses on the development of ultra-broadband scanning evanscent probe microscopy and spectroscopy; this instrumentation will target the ability to simultaneously measure a set of compositional and performance properties of chemically testured samples. Results for variable-composition oxide and polymeric samples will be highlighted.
MULTISPECTRAL PROBES FOR MATERIALS AND CHEMICAL ANALYSIS