Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 45126 - 45150 of 73697

Cooling of a Single Atom in an Optical Trap Inside a Resonator

July 1, 2001
Author(s)
S J. van Enk, J McKeever, H J. Kimble, Jun Ye
We present detailed discussions of cooling and trapping mechanisms for an atom in an optical trap inside an optical cavity, as relevant to recent experiments. The interference pattern of cavity QED and trapping fields in space makes the trapping wells

Dark Pulse Formation in a Quantum Dot Laser

July 1, 2001
Author(s)
Jonathan Zimmerman, Steven T. Cundiff, G von Plessen, J Feldmann, M Arzberger, J Bohm, M C. Amann, G Abstreiter
The laser emission of an InAS/GaAs quantum dot laser after injection of a non-resonant optical pulse is time resolved using femtosecond upconversion. The injected pulse burns a spectral hole into the gain spectrum that leads to an ultrafast redistribution

Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials

July 1, 2001
Author(s)
James R. Baker-Jarvis, Michael D. Janezic, Billy F. Riddle, Christopher L. Holloway, Nicholas Paulter, J Blendell
This is an overview of dielectric measurement methods and metrology on substrate materials used in electronic packaging. These substrates include low-temperature co-fired ceramic, high-temperature co-fired ceramic substrates, printed wiring board, and

DTA/TGA Study of Eutectic Melting in the System BaF 2 -BaO-Y 2 O 3 -CuO x -H 2 O

July 1, 2001
Author(s)
Lawrence P. Cook, Winnie K. Wong-Ng, J Suh
Differential thermal analysis and thermogravimetric analysis (DTA/TGA) experiments have been completed in the BaF2-BaO-Y2O3-CuOx-H2O system at various oxygen pressures to determine the effect of adding BaF2 and H2O on the eutectic melting in the system BaO

Dynamical Tunnelling of Ultracold Atoms

July 1, 2001
Author(s)
W K. Hensinger, H Heffner, A Browaeys, N R. Heckenberg, Kristian Helmerson, C R. McKenzie, G J. Milburn, William D. Phillips, S L. Rolston, H Rubinsztein-Dunlop, B Upcroft
Nowhere does the divergence of the quantum and classical descriptions of particle motion become more apparent than in quantum tunneling between two regions of classically stable motion. An archetype of such nonclassical motion, studied since the earlies

Dynamics of Collapsing and Exploding Bose-Einstein Condensates

July 1, 2001
Author(s)
E A. Donley, N R. Claussen, S L. Cornish, J L. Roberts, Eric A. Cornell, C E. Wieman
We have explored the dynamics of how a Bose-Einstein condensate collapses when it is suddenly put into the unstable regime of attractiveinteractions. The ability to change the strength and sign of the inter-atomic interactions by tuning the magnetic field

Elastic Constants of Mullite Containing Alumina Platelets

July 1, 2001
Author(s)
H M. Ledbetter, Sudook A. Kim, Martin Dunn, Z Xu, S Crudele, W Kriven
Using dynamic methods, we measured the elastic constants of a composite comprising alumina platelets (0.2 volume fraction) in a 3:2-mullite matrix. Instead of the expected elastic stiffening, we found an elastic softening. For example, the Young modulus

Electrometrology and NIST -- New Directions

July 1, 2001
Author(s)
William E. Anderson
I gaze into a somewhat cloudy crystal ball to predict the directions of electrical metrology in the next fifteen years. The emphasis on standards based on fundamental constants of nature and on quantum-mechanical principles will move from the base units to

Exchange Anisotropy in NiFe Films on (100) NiO Single-Crystal Substrate

July 1, 2001
Author(s)
S M. Rezende, M A. Lucena, A Azevedo, A B. Oliveria, F M. de Aguiar, William F. Egelhoff Jr.
The exchange anisotropy in a Ni81Fe19 film sputtered on a (100) NiO single-crystal substrate is investigated with MOKE magnetometry, ferromagnetic resonance (FMR) and Brillouin light scattering (BLS). The dependencies of the spin-wave frequency and FMR

FEA Modeling and Hardness Performance Prediction of Rockwell Diamond Indenters

July 1, 2001
Author(s)
Hui Zhou, Jun-Feng Song, Samuel Low, Li Ma
The difficulty in manufacturing Rockwell diamond indenters to the required geometric specifications has resulted in most commercially manufactured indenters to vary in shape from one indenter to another. This difference in shape is thought to be a major

FEA Modeling and Hardness Performance Prediction of Rockwell Diamond Indenters

July 1, 2001
Author(s)
Li Ma, J Zhou, Samuel R. Low III, Jun-Feng Song
The difficulty in manufacturing Rockwell diamond indenters to the required geometric specifications has resulted in most commercially manufactured indenters to vary in shape from one indenter to another. This difference in shape is thought to be a major

From Stars to Spheres: A SAXS Analysis of Dilute Dendrimer Solutions

July 1, 2001
Author(s)
T J. Prosa, Barry J. Bauer, Eric J. Amis
The progression of intramolecular organizations within a series of dilute poly(amino amine) (PAMAM) dendrimer/methanol solutions is examined by use of small angle x-ray scattering (SAXS) combined with comparisons to various electron density models. The

High Frequency Measurements of CoFeHfO Thin Films

July 1, 2001
Author(s)
Stephen E. Russek, Pavel Kabos, Thomas J. Silva, Fred B. Mancoff, D Wang, Z. T. Qian, J. M. Daughton
High frequency measurements of the transverse susceptibility and damping constant of CoFeHfo thin films have been made over a frequency range of 0.1 GHz to 6 GHz as a function of film resistivity, thickness, and temperature. The films show relatively low
Displaying 45126 - 45150 of 73697
Was this page helpful?