Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

High Frequency Measurements of CoFeHfO Thin Films



Stephen E. Russek, Pavel Kabos, Thomas J. Silva, Fred B. Mancoff, D Wang, Z. T. Qian, J. M. Daughton


High frequency measurements of the transverse susceptibility and damping constant of CoFeHfo thin films have been made over a frequency range of 0.1 GHz to 6 GHz as a function of film resistivity, thickness, and temperature. The films show relatively low high-frequency damping with the damping constant a ranging from 0.01 to 0.06. The damping constant increases with film resistivity and, for the highest resistivity films, the damping constant decreases as the thickness increases. The damping constant, induced anisotropy, and film resistivity show weak temperature dependence over a temperature range from 4 K to 300 K. The low damping constant, in conjunction with the high anisotropy and large spin-dependent tunneling magnetoresistance, makes this material attractive for high frequency magnetic device applications.
IEEE Transactions on Magnetics


CoFeHfO, FMR, magnetic device dynamics, magneto-electronics


Russek, S. , Kabos, P. , Silva, T. , Mancoff, F. , Wang, D. , Qian, Z. and Daughton, J. (2001), High Frequency Measurements of CoFeHfO Thin Films, IEEE Transactions on Magnetics, [online], (Accessed July 19, 2024)


If you have any questions about this publication or are having problems accessing it, please contact

Created June 30, 2001, Updated October 12, 2021