Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Exchange Anisotropy in NiFe Films on (100) NiO Single-Crystal Substrate

Published

Author(s)

S M. Rezende, M A. Lucena, A Azevedo, A B. Oliveria, F M. de Aguiar, William F. Egelhoff Jr.

Abstract

The exchange anisotropy in a Ni81Fe19 film sputtered on a (100) NiO single-crystal substrate is investigated with MOKE magnetometry, ferromagnetic resonance (FMR) and Brillouin light scattering (BLS). The dependencies of the spin-wave frequency and FMR resonance field with the angle of the in-place field are strikingly different than in polycrystalline samples. The BLS and FMR data are interpreted with a model that includes a planar domain wall in the AF substrate while the exhange field in the single-crystal sample is quite larger than in NiFe films on polycrystalline NiO layers, the domain wall field is smaller.
Citation
Journal of Magnetism and Magnetic Materials
Volume
226-230
Issue
Part 2

Keywords

magnetic excitations, multilayers-metallic, resonance-ferromagnetic, spin waves

Citation

Rezende, S. , Lucena, M. , Azevedo, A. , Oliveria, A. , de Aguiar, F. and Egelhoff Jr., W. (2001), Exchange Anisotropy in NiFe Films on (100) NiO Single-Crystal Substrate, Journal of Magnetism and Magnetic Materials (Accessed June 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created June 30, 2001, Updated October 12, 2021