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Exchange Anisotropy in NiFe Films on (100) NiO Single-Crystal Substrate

Published

Author(s)

S M. Rezende, M A. Lucena, A Azevedo, A B. Oliveria, F M. de Aguiar, William F. Egelhoff Jr.

Abstract

The exchange anisotropy in a Ni81Fe19 film sputtered on a (100) NiO single-crystal substrate is investigated with MOKE magnetometry, ferromagnetic resonance (FMR) and Brillouin light scattering (BLS). The dependencies of the spin-wave frequency and FMR resonance field with the angle of the in-place field are strikingly different than in polycrystalline samples. The BLS and FMR data are interpreted with a model that includes a planar domain wall in the AF substrate while the exhange field in the single-crystal sample is quite larger than in NiFe films on polycrystalline NiO layers, the domain wall field is smaller.
Citation
Journal of Magnetism and Magnetic Materials
Volume
226-230
Issue
Part 2

Keywords

magnetic excitations, multilayers-metallic, resonance-ferromagnetic, spin waves

Citation

Rezende, S. , Lucena, M. , Azevedo, A. , Oliveria, A. , de Aguiar, F. and Egelhoff Jr., W. (2001), Exchange Anisotropy in NiFe Films on (100) NiO Single-Crystal Substrate, Journal of Magnetism and Magnetic Materials (Accessed October 7, 2024)

Issues

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Created June 30, 2001, Updated October 12, 2021