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Displaying 44276 - 44300 of 143806

Wildfire Modeling.

November 22, 2011
Author(s)
Steven K. Krueger
This report documents the development and testing of the LES (Large Eddy Simulator) version of the WRF (Weather Research and Forecasting) model coupled with SFIRE, the wildland surface fire module, to simulate wildland fires. The relevance of this work to

Tracking the National Fire Problem: The Data behind the Statistics

November 21, 2011
Author(s)
Douglas S. Thomas, David T. Butry
The objective of this report is to support the development of descriptive statistics and associated measures of uncertainty for characterizing, tracking, and better understanding the root causes of the U.S. fire burden by identifying the relevant costs and

Phase-Sensitive Specular Neutron Reflectometry for Imaging the Nanometer Scale Compositional Depth profile of Thin-Film Materials

November 20, 2011
Author(s)
Brian Kirby, Paul A. Kienzle, Brian B. Maranville, Norman F. Berk, J. Krycka, Frank Heinrich, Charles Majkrzak
Neutron reflectometry is a powerful method for probing the molecular scale structure of both hard and soft condensed matter films. Moreover, the phase-sensitive methods which have been developed make it possible for specular neutron reflectometry to be

Evaluation of Proposed Test Artifacts for Five-Axis Machine Tools

November 18, 2011
Author(s)
Shawn P. Moylan, David Blumenfeld, Michael L. McGlauflin, Ronnie R. Fesperman Jr., M A. Donmez
Machining of a test artifact is an attractive method of evaluating the performance of a machine tool because the tests are often quick and do not require special instrumentation. An appropriate artifact should be complex enough to assess a machine's

Giant piezoelectricity on Si for hyperactive MEMS

November 18, 2011
Author(s)
S. H. Baek, J. Park, D. M. Kim, Vladimir Aksyuk, R. R. Das, S. D. Bu, D. A. Felker, J. Lettieri, V Vaithyanathan, S. Bharadwaja, N. Bassiri-Gharb, Y. B. Chen, H. P. Sun, C. M. Folkman, H. W. Jang, D. J. Kreft, S K. Streiffer, R. Ramesh, X Q. Pan, S Trolier-McKinstry, Darrell G. Schlom, M. S. Rzchowski, R. Blick, C. B. Eom
Smart materials that can sense, manipulate, and position are crucial to the functionality of micro- and nano-machines [1-2]. Integration of single crystal piezoelectric films on silicon offers the opportunity of high performance piezoelectric

Origin of Electrical Signals for Plasma Etching Endpoint Detection

November 18, 2011
Author(s)
Mark A. Sobolewski
Electrical signals are used for endpoint detection in plasma etching, but the origin of the electrical changes observed at endpoint is not known. They may be caused by changes in the gas-phase densities of etch products and reactants or by changes in

TSOM Method for Nanoelectronics Dimensional Metrology

November 18, 2011
Author(s)
Ravikiran Attota
Through-focus scanning optical microscopy (TSOM) is a relatively new method that transforms conventional optical microscopes into truly three-dimensional metrology tools for nanoscale to microscale dimensional analysis. TSOM achieves this by acquiring and
Displaying 44276 - 44300 of 143806
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