U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 43451 - 43475 of 73778

Designing Neutral-Atom Nanotraps With Integrated Optical Waveguides

April 1, 2002
Author(s)
J P. Burke, S G. Chu, Garnett W. Bryant, Carl J. Williams, Paul S. Julienne
Integrated optical structures offer the intriguing potential of compact, reproducible waveguide arrays, rings, Y-junctions, etc, that could be used to design evanescent field traps to transport, store, and interact atoms in networks as complicated as any

Direct RF to Optical Frequency Measurements With a Femtosecond Laser Comb

April 1, 2002
Author(s)
Scott A. Diddams, D J. Jones, Jun Ye, S T. Cundiff, John L. Hall, J K. Ranka, R S. Windeler
By spanning an optical octave (> 300 THz) with a broadened femtosecond laser frequency comb, we directly measure optical frequency standards at 1064/532nm, 633 nm and 778 nm in terms of the microwave frequency that controls thecomb spacing, which can be

Empirical Modeling Methods Using Partial Data

April 1, 2002
Author(s)
Gerard N. Stenbakken, Ruimin Liu, Gene Huang
Methods were developed to calculate empirical models for device error behavior from data sets with missing data. These models can be used to develop reduced point testing procedures for the devices. The partial data methods reduce the prediction

Friction Measurements of Ultra-Thin Carbon Overcoats in Air

April 1, 2002
Author(s)
P M. McGuiggan, C S. Bhatia, D Bogy, W Fong, Stephen M. Hsu
The friction force as a function of humidity was measured between 5 nm thick carbon films coated onto mica surfaces. The friction was found to be proportional to the area of contact. The shear stress at 0%, 33%, and 100% humidity was measured to be 25 +6

Grafting Segments from the Extracellular Surface of CCR5 onto a Bacteriorhodopsin Transmembrane Scaffold Confers HIV-1 Corcceptor Activity

April 1, 2002
Author(s)
N G. Abdulaev, T T. Strassmaier, T Ngo, R W. Chen, H Lueke, D D. Oprian, K D. Ridge
The G-protein coupled receptor CCR5 binds three distinct B-chemokines on the solvent exposed segments of the extracellular surface. This same region of CCr5 also interacts with certain macrophage-tropic strains of HIV-1. To investigate structural features

High Throughput Methods for Materials R&D: A Growing Effort at NIST

April 1, 2002
Author(s)
Leonid A. Bendersky, J D. Hewes
The U.S. private sector has indicated that the National Institute of Standards and Technology has a role to play in facilitating the implementation of high throughput experimentation, for example using combinatorial methods. The Advanced Technology Program

Improved IDDQ Testing With Empirical Linear Prediction

April 1, 2002
Author(s)
David I. Bergman, Hans Engler
A new linear prediction method that improves IDDQ test effectiveness is described. The method uses statistical pre-processing of exhaustive measurements on training devices to extract principal patterns in the device IDDQ behavior and to generate a

Influence of Processing Rate and Formulation on the Interface Strength of Vinyl Ester/E-Glass Composites

April 1, 2002
Author(s)
Walter G. McDonough, Joy Dunkers, Gale A. Holmes, E Feresenbet, Y H. Kim, Richard~undefined~undefined~undefined~undefined~undefined Parnas
The single fiber fragmentation test was used to investigate the effect of gelation time on interfacial shear properties of fast reacting resin systems. We developed a processing system capable of producing single fiber fragmentation samples with gelation

It's Bound to Be Right

April 1, 2002
Author(s)
Isabel M. Beichl, F Sullivan
This is a tutorial article on a Monte Carlo method for eliminating double counting in massive data sets. It has also been used to classify images.

Measurement of the Linewidth of Electrical Test-Structure Reference Features by Automated Phase-Contrast Image Analysis

April 1, 2002
Author(s)
B A. am Ende, Michael W. Cresswell, Richard A. Allen, T J. Headley, William F. Guthrie, Loren W. Linholm, H Bogardus, Christine E. Murabito
NIST, Sandia National Laboratories, and International SEMATECH are developing a new type of linewidth standard for calibrating Critical Dimension (CD) metrology instruments for lithographic process control. The standard reference feature is the bridge of
Displaying 43451 - 43475 of 73778
Was this page helpful?