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Improved IDDQ Testing With Empirical Linear Prediction
Published
Author(s)
David I. Bergman, Hans Engler
Abstract
A new linear prediction method that improves IDDQ test effectiveness is described. The method uses statistical pre-processing of exhaustive measurements on training devices to extract principal patterns in the device IDDQ behavior and to generate a prediction model. Fitting the model to device measurements accommodates variations in the fabrication process. Comparison with the Δ IDDQ test method using the SEMATECH S-121 data shows that for nearly equal numbers of defective parts passed, the new method fails fewer defect-free parts.
Proceedings Title
Improved IDDQ Testing With Empirical Linear Prediction
Bergman, D.
and Engler, H.
(2002),
Improved IDDQ Testing With Empirical Linear Prediction, Improved IDDQ Testing With Empirical Linear Prediction, , USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30116
(Accessed October 14, 2025)