Bergman, D.
and Engler, H.
(2002),
Improved IDDQ Testing With Empirical Linear Prediction, Improved IDDQ Testing With Empirical Linear Prediction, , USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30116
(Accessed October 14, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Improved IDDQ Testing With Empirical Linear Prediction
Published
Author(s)
, Hans Engler
Abstract
A new linear prediction method that improves IDDQ test effectiveness is described. The method uses statistical pre-processing of exhaustive measurements on training devices to extract principal patterns in the device IDDQ behavior and to generate a prediction model. Fitting the model to device measurements accommodates variations in the fabrication process. Comparison with the Δ IDDQ test method using the SEMATECH S-121 data shows that for nearly equal numbers of defective parts passed, the new method fails fewer defect-free parts.Proceedings Title
Improved IDDQ Testing With Empirical Linear Prediction
Conference Location
, USA
Pub Type
Conferences
Download Paper
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created March 31, 2002, Updated October 12, 2021