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Improved IDDQ Testing With Empirical Linear Prediction

Published

Author(s)

David I. Bergman, Hans Engler

Abstract

A new linear prediction method that improves IDDQ test effectiveness is described. The method uses statistical pre-processing of exhaustive measurements on training devices to extract principal patterns in the device IDDQ behavior and to generate a prediction model. Fitting the model to device measurements accommodates variations in the fabrication process. Comparison with the Δ IDDQ test method using the SEMATECH S-121 data shows that for nearly equal numbers of defective parts passed, the new method fails fewer defect-free parts.
Proceedings Title
Improved IDDQ Testing With Empirical Linear Prediction
Conference Location
, USA

Citation

Bergman, D. and Engler, H. (2002), Improved IDDQ Testing With Empirical Linear Prediction, Improved IDDQ Testing With Empirical Linear Prediction, , USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30116 (Accessed July 13, 2024)

Issues

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Created March 31, 2002, Updated October 12, 2021