TY  - CONF
AU  - David Bergman
AU  - Hans Engler
C2  - Improved IDDQ Testing With Empirical Linear Prediction, , USA
DA  - 2002-04-01 00:04:00
LA  - en
PB  - Improved IDDQ Testing With Empirical Linear Prediction, , USA
PY  - 2002
TI  - Improved IDDQ Testing With Empirical Linear Prediction
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=30116
ER  -