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Search Publications

NIST Authors in Bold

Displaying 43426 - 43450 of 74067

A Decomposition-Based Approach to Layered Manufacturing

June 1, 2002
Author(s)
I Llinkin, R Janardan, J J. Majhi, J Schwerdt, Miles E. Smid, Ram D. Sriram
This paper introduces a new approach for improving the performance and versatility of Layered Manufacturing (LM), which is an emerging technology that makes it possible to build physical prototypes of 3D parts directly from their computer models using a

A High-Energy X-Ray Spectrometer Diagnostic for the OMEGA Laser

June 1, 2002
Author(s)
Lawrence T. Hudson, Albert Henins, R Deslattes, J Seely, G Holland, R Atkin, L Marlin, D D. Meyerhofer, C Stoeckl
A new x-ray diagnostic has been commissioned recently at the OMEGA laser facility at the University of Rochester. It is a transmission curved crystal spectrometer designed primarily to characterize the hot-electron energy distribution of laser generated

A Microshear Test to Measure Bond Strengths of Dentin-Polymer Interfaces

June 1, 2002
Author(s)
Walter G. McDonough, Joseph M. Antonucci, J He, Y Shimada, Martin Y. Chiang, Gary E. Schumacher, Carl R. Schultesiz
Mechanical property tests such as the diametral tensile, uniaxial tensile and transverse strength tests are commonly used in studying the interfacial properties of the bond between dental composites and dental substrates such as dentin and enamel. These

A New Usability Standard and What It Means to You

June 1, 2002
Author(s)
Jean C. Scholtz, Emile L. Morse
The Common Industry Format (CIF) was approved on December 12, 2001 as an ANSII standard (ANSI/NCITS-354-2001). The CIF is a deliverable from the Industry USability Reporting (IUSR) Project begun in 1997, facilitated by the National Institute of Standards

About Substitution for Ozone-Depleting Agents for Fire Extinguishing

June 1, 2002
Author(s)
A N. Baratov, N P. Kopylov, E V. Timofeev
New ozone-friendly fire extinguishing mixtures based on iodinated halons are proposed in the present paper. They act on a flame both chemical inhibitor and diluent. It was obtained that mixture CF3H+CH3I has value of minimum fire extinguishing

Advances in Weld Hydrogen Sensors

June 1, 2002
Author(s)
David Olson, B. Mishra, R D. Smith, S. Niyomsoan, P. Termsuksawad, Y D. Park, V I. Kaydanov, Z Gavra, Ronald B. Goldfarb
Through the application of modern physics concepts, advanced hydrogen sensors are being developed for rapid determination of weld hydrogen content and distribution. Electronic, optical, and magnetic property measurements have demonstrated the ability to

An AC Josephson Source for Johnson Noise Thermometry

June 1, 2002
Author(s)
Samuel Benz, John M. Martinis, Paul Dresselhaus, Sae Woo Nam
We have adapted the Josephson arbitrary waveform synthesizer to create a quantized voltage source suitable for calibrating the cross-correlation electronics of a Johnson noise thermometer system. The requirements of long term stability and low voltage

An Improved Sensor for the NIST Cryogenic Thermal Transfer Standard

June 1, 2002
Author(s)
Thomas E. Lipe Jr., Carl D. Reintsema, Joseph R. Kinard Jr.
We are developing a new primary standard of ac-dc difference, based on a resistive superconducting transition-edge sensor. We describe the performance limitations of the present device, and present a new sensor design which will improve the operating

An Updated Set of Basic Linear Algebra Subprograms (BLAS)

June 1, 2002
Author(s)
L S. Blackford, Roldan Pozo, Et al
This paper updates the ongoing BLAS effort, and summarizes what types of operations are now available. We now have flavors of BLAS for dense, banded, and sparse vector and matrix operations. Some BLAS are also supported in extended and mixed precision

Applying a Methodology for Microtensile Analysis of Thin Films

June 1, 2002
Author(s)
B Yeung, Alan M. Lytle, V Sarihan, David T. Read, Y F. Guo
A Microtensile methodology, developed at The National Institute of Standards and Technology (NIST), has been adopted and applied in Motorola to evaluate material properties of thin films. this methodology is a significant part of the materials technology

Calibration of a Stopping Power Model for Silicon Based on Analysis of Neutron Depth Profiling and Secondary Ion Mass Spectrometry Measurements

June 1, 2002
Author(s)
Kevin J. Coakley, Huaiyu H. Chen-Mayer, George P. Lamaze, David S. Simons, P E. Thompson
We measure the boron concentration versus depth profile within a silicon sample with four delta-doped planes by secondary ion mass spectrometry. In a neutron depth profiling (NDP) experiment, we illuminate the sample with a neutron beam. Nuclear reactions

CD Reference Materials for Sub-Tenth Micrometer Applications

June 1, 2002
Author(s)
Michael W. Cresswell, E. Hal Bogardus, Joaquin (. Martinez, Marylyn H. Bennett, Richard A. Allen, William F. Guthrie, Christine E. Murabito, B A. am Ende, Loren W. Linholm
Prototype linewidth reference materials with Critical Dimensions (CDs) as narrow as 70 nm have been patterned in (110) silicon-on-insulator films. The sidewalls of the reference features are parallel, normal to the substrate surface, and have almost

Ceramic Based Layer Structures for Biomechanical Applications

June 1, 2002
Author(s)
Brian R. Lawn
A survey of recent advances in the analysis of ceramic-based layer structures for biomechanical applications is presented. Data on model layer systems, facilitating development of explicit fracture mechanics relations for predicting critical loads to
Displaying 43426 - 43450 of 74067
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