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Catalytic Carbon K Edge X-ray Absorption Spectroscopy: Multilayer Mirror Detection System

Published

Author(s)

Daniel A. Fischer, S Sambasivan, A Kuperman, Y Platonov, J L. Wood

Abstract

Fluorescence yield x-ray absorption spectroscopy of the low Z elements C, N, O, and F is a powerful tool for understanding the local structure and chemistry of diverse materials, even in the presence of reactive atmospheres. This technique uses tunable monochromatic synchrotron radiation in the soft x-ray region to excite inner shell electrons to unoccupied molecular orbitals, providing both elemental tunability and chemical state sensitivity in complex systems (also called, Near Edge X-ray Absorption Fine Structure, NEXAFS). By monitoring carbon fluorescence yield during soft x-ray absorption, a photon-in photon-out spectroscopy has been developed for in-situ single crystal surface science experiments involving chemisorption, displacement, and dehydrogenation.
Citation
NSLS Activity Report 2001

Keywords

detectors, multilayers, NEXAFS, soft x-ray

Citation

Fischer, D. , Sambasivan, S. , Kuperman, A. , Platonov, Y. and Wood, J. (2002), Catalytic Carbon K Edge X-ray Absorption Spectroscopy: Multilayer Mirror Detection System, NSLS Activity Report 2001 (Accessed May 26, 2024)

Issues

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Created April 1, 2002, Updated February 19, 2017