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NIST Authors in Bold

Displaying 42601 - 42625 of 73960

Master-Slave Cluster Based Multihop Ad-hoc Networking

December 1, 2002
Author(s)
Hamid Gharavi, K Ban
This paper presents a master-slave cluster based mobile ad-hoc network architecture for multihop communications using the IEEE 802.11 system. The proposed architecture is a mixture of two different types of networks: managed (master-and-slave) and ad-hoc

Measurement of the Spatial Evolution of the Deprotection Reaction Front With Nanometer Resolution Using Neutron Reflectometry

December 1, 2002
Author(s)
Eric K. Lin, Sushil K. Satija, Wen-Li Wu, Christopher L. Soles, D L. Goldfarb, B C. Trinque, S D. Burns, Ronald L. Jones, Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, M Angelopoulos, C G. Willson
The use of chemically amplified photoresists for the fabrication of sub-100 nm features will require spatial control with nanometer level resolution. To reach this goal, a detailed understanding of the complex reaction-diffusion mechanisms at these length

Microstructure-Based Simulation of Thermomechanical Behavior of Composite Materials by Object-Oriented Finite Element Analysis

December 1, 2002
Author(s)
N Chawla, B V. Patel, M Koopman, K K. Chawla, R Saha, B R. Patterson, Lin-Sien H. Lum, Stephen A. Langer
While it is well recognized that microstructure controls the physical and mechanical properties of a material, the complexity of the microstructure often makes it difficult to simulate by analytical or numerical techniques. In this paper we present a

Multiple Small-Angle Neutron Scattering Studies of Anisoptropic Materials

December 1, 2002
Author(s)
Andrew J. Allen, Norman F. Berk, J Ilavsky, Gabrielle G. Long
Various authors have recognized the power of multiple small-angle neutron scattering (MSANS) analysis in providing information on coarse, concentrated microstructures involving micrometer length-scales larger than are accessible in conventional small-angle

New NIST Photomask Linewidth Standard

December 1, 2002
Author(s)
James E. Potzick, J Pedulla, Michael T. Stocker
NIST is preparing to issue the next generation in its line of binary photomask linewidth standards. Called SRM 2059, it was developed for calibrating microscopes used to measure linewidths on photomasks, and consists of antireflecting chrome line and space

NIST Standards for Microanalysis and the Certification Process

December 1, 2002
Author(s)
Ryna B. Marinenko
Procedures for testing research materials for the determination of the extent of within-specimen heterogeneity and between-specimen heterogeneity are described. These procedures, which have been developed and used at NIST in the certification of several

Overview: Damage in Brittle Layer Structures From Concentrated Loads

December 1, 2002
Author(s)
Brian R. Lawn, Y N. Deng, P Miranda, Antonia Pajares, H Chai, D H. Kim
In this article, we review recent advances in the understanding and analysis of damage initiation and evolution in laminate structures with brittle outlayers and compliant sublayers, in concentrated loading. The relevance of such damage to lifetime

Phase Diagrams for Lead-Free Solder Alloys

December 1, 2002
Author(s)
Ursula R. Kattner
The need for new improved solder alloys and better understanding of reactions during the soldering process grow steadily as the need for smaller and more reliable electronic products grows. A candidate solder alloy needs to fulfill basic requirements

Photomask Dimensional Metrology in the SEM: Has Anything Really Changed?

December 1, 2002
Author(s)
Michael T. Postek, Andras Vladar, Marylyn H. Bennett
Photomask dimensional metrology in the scanning electron microscope (SEM) has not evolved as rapidly as the metrology of resists and integrated circuit features on wafers. This has been due partly to the 4x (or 5x) reduction in the optical steppers and

Polymer/Layered Silicate Nanocomposites from Thermally Stable Trialkylimidazolium-Treated Montmorillonite.

December 1, 2002
Author(s)
Jeffrey W. Gilman, W H. Awad, Rick D. Davis, John R. Shields, Richard H. Harris Jr., C H. Davis, A B. Morgan, T E. Sutto, J H. Callahan, Paul C. Trulove, H DeLong
The limited thermal stability of alkylammonium cations intercalated into smectite minerals (e.g., montmorillonite, MMT) and the processing instability of some polymers [polyamide-6 (PA-6) and polystyrene (PS)] in the presence of nanodispersed MMT have

Preface to Cavity-Enhanced Spectroscopies

December 1, 2002
Author(s)
Roger D. van Zee, J P. Looney
This submission is an introduction to Cavity-Enhanced Spectroscopy, a book which is to be published by Academic Press.

Refrigeration Methods for Superconductors

December 1, 2002
Author(s)
Ray Radebaugh
This chapter reviews various methods commonly used for achieving the cryogenic temperatures required of superconducting materials. The problems associated with cryogenic refrigerators (cryocoolers), such as poor reliability, low efficiency, electromagnetic

Report of the 87th National Conference on Weights and Measures

December 1, 2002
Author(s)
H V. Oppermann, T L. Grimes
The 87th Annual Meeting of the National Conference on Weights & Measures (NCWM) was held July 14 through July 18, 2002, at the Omni Netherland Holtel, Cincinnati, OH. The theme of the meeting was A Progressive Partnership for the Future--You and NCWM
Displaying 42601 - 42625 of 73960
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