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Displaying 42126 - 42150 of 74202

Development of a CD-ROM Metrology Course at NIST

January 1, 2003
Author(s)
Georgia L. Harris
The NIST Weights and Measurements Division (WMD), formerly the Office of Weights and Measures (OWM), conducts training in mass metrology at basic, intermediate, and advanced levels. Over the years, the demand for these courses greatly exceeded the

Diatomic spectral database

January 1, 2003
Author(s)
Francis J. Lovas, E Tiemann, J S. Coursey, Svetlana A. Kotochigova, Jeffrey Chang, Karen J. Olsen, Robert A. Dragoset

Diffusion Barrier Cladding in Si/SiGe Resonant Interband Tunneling Diodes and Their Patterned Growth on PMOS Source/Drain Regions

January 1, 2003
Author(s)
N Jin, A T. Rice, P R. Berger, P E. Thompson, C Rivas, R Lake, S Sudirgo, J J. Kempisty, B Curanovic, S L. Rommel, K D. Hirschman, S K. Kurinec, P Chi, David S. Simons, S.J. Chung
Si/SiGe resonant interband tunnel diodes (RITD) employing delta-doping spikes that demonstrate negative differential resistance (NDR) at room temperature are presented. Efforts have focused on improving the tunnel diode peak-to-valley current ratio (PVCR)

Displacement Uncertainty in Interferometric Radius Measurements

January 1, 2003
Author(s)
Tony L. Schmitz, Christopher J. Evans, Angela Davies, William T. Estler
Interferometric radius measurements may be completed using a radius bench, where radius is defined as the displacement between the confocal and cat?s eye nulls (identified using a figure measuring interferometer). Measurements of a Zerodur sphere have been

Distribution of Earthquake Input Energy in Structures

January 1, 2003
Author(s)
P Khashaee, B Mohraz, Fahim H. Sadek, Hai S. Lew, John L. Gross
In developing an energy-based design approach and assessing the damage potential of structures, one must know the distribution of earthquake input energy among energy components: kinetic, elastic strain, hysteretic, and damping. This report examines the

DNA-Based Sensors

January 1, 2003
Author(s)
Michael J. Tarlov, A B. Steel
The development of DNA-based sensors for genetic assay and sequencing applications has exploded over the last decade. Nearly all of these devices rely on the hybridization of a complementary oligonucleotide with surface-confined, single-stranded DNA or RNA

Early Reliability Assessment Using Deep Censoring

January 1, 2003
Author(s)
Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan
A method is described for making direct characterizations of the early part of the intrinsic electromigration fail-time distribution of interconnects. The method involves stressing a large number of test lines only long enough for a relatively few lines to
Displaying 42126 - 42150 of 74202
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