Interlaboratory Comparison of Magnetic Thin Film Measurements

Published

April 1, 2003

Author(s)

F C. Da silva, Chih-Ming Wang, D P. Pappas

Abstract

A potential low magnetic moment standard reference material (SRM) was studied in an interlaboratory comparison. The mean and the standard deviation of the saturation moment m/s, the remanent moment m/^r, and the intrinsic coercivity H/c of nine samples were extracted from hysteresis loop measurements. Samples were measured by 13 laboratories using inductive-field loopers, vibrating sample magnetometers, alternating gradient force magnetometers, and superconducting quantum-interference-device magnetometers. NiFe films on Si substrates had saturation moment measurements reproduced within 5 % variation among the laboratories. The results show that a good candidate for an SRM must have a highly square hysteresis loop (m/^r/m/^s > 90 %), H/^c = 400 A.m /^-1 (5 Oe, and m s = 2 x 10 _-7/A.m 2 (2 x 10/_-4 emu).

Citation

Journal of Research (NIST JRES) - of

Report Number

of

NIST Pub Series

Journal of Research (NIST JRES)

Pub Type

NIST Pubs

Download Paper

Local Download

Citation

Da silva, F. , Wang, C. and Pappas, D. (2003), Interlaboratory Comparison of Magnetic Thin Film Measurements, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50794 (Accessed October 21, 2025)