Da silva, F.
, Wang, C.
and Pappas, D.
(2003),
Interlaboratory Comparison of Magnetic Thin Film Measurements, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=50794
(Accessed April 30, 2024)
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Interlaboratory Comparison of Magnetic Thin Film Measurements
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F C. Da silva, , D P. Pappas
Abstract
A potential low magnetic moment standard reference material (SRM) was studied in an interlaboratory comparison. The mean and the standard deviation of the saturation moment m/s, the remanent moment m/r, and the intrinsic coercivity H/c of nine samples were extracted from hysteresis loop measurements. Samples were measured by 13 laboratories using inductive-field loopers, vibrating sample magnetometers, alternating gradient force magnetometers, and superconducting quantum-interference-device magnetometers. NiFe films on Si substrates had saturation moment measurements reproduced within 5 % variation among the laboratories. The results show that a good candidate for an SRM must have a highly square hysteresis loop (m/r/m/s > 90 %), H/c = 400 A.m /-1 (5 Oe, and m s = 2 x 10 -7/A.m 2 (2 x 10/-4 emu).Citation
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Created March 31, 2003, Updated October 12, 2021