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Displaying 41601 - 41625 of 74090

Complex Permittivity Measurements of Common Plastics over Variable Temperatures

March 1, 2003
Author(s)
Billy F. Riddle, James R. Baker-Jarvis, Jerzy Krupka
In this paper we present complex permittivity data at macorwave frequencies for many common plastics from 125 K to 375 K. The measurements were made using a TE 01δ dielectric resonator placed inside an environmental chamber. Data are presented for the

Cracking and the Indentation Size Effect for Knoop Hardness of Glasses

March 1, 2003
Author(s)
George D. Quinn, P Green, K Xu
The Knoop Hardness of five glasses as measured over a wide range of indentation loads. Hardness decreased with increasing load in accordance with the classic indentation size effect (ISE). At moderate loads, cracking dramatically altered the indentation

Creation of a Dipolar Superfluid in Optical Lattices

March 1, 2003
Author(s)
B Damski, L Santos, E Tiemann, M Lewenstein, Svetlana A. Kotochigova, Paul S. Julienne, W.H. Zoller
We show that by loading a Bose-Einstein condensate (BEC) of two different atomic species into an optical lattice, it is possible to achieve a Mott-insulator phase with exactly one atom of each species per lattice site. A subsequent photo-association leads

Critical Dimension and Overlay Metrology

March 1, 2003
Author(s)
Michael T. Postek, Marylyn H. Bennett
Critical dimension and overlay metrology are two of the important measurements made in semiconductor device fabrication. Critical dimension metrology is important to ensure that the product meets the design target and overlay metrology ensures correct

Decay and Revival of Phase Coherence of a Bose-Einstein Condensate in a One-Dimensional Lattice

March 1, 2003
Author(s)
O Morsch, J H. Muller, D Ciampini, M Cristiani, P B. Blakie, Carl J. Williams, Paul S. Julienne, E Arimondo
The mode structure of a Bose-Einstein condensate non-adiabatically loaded into a one-dimensional optical lattice is studied by analyzing the visibility of the interference pattern as well as the radial profile of the condensate after a time-of-flight. A

Dielectric Permittivity of Eight Gases Measured with Cross Capacitors

March 1, 2003
Author(s)
James W. Schmidt, Michael R. Moldover
A 4-ring, toroidal cross capacitor was used to measure accurately the relative dielectric permittivity ε(p,T) of He, Ar, N 2, O 2, CH 4, C 2H 6, C 3H 8, and CO 2. (ε is often called the dielectric constant. ) The data are in the range from 0 C to 50 C and

Effect of Caged Fluorescent Dye on the Electroosmotic Mobility in Microchannels

March 1, 2003
Author(s)
David J. Ross, Laurie E. Locascio
We report on measurements of electroosmotic mobility in polymer microchannels and silica capillaries with and without the addition of a caged fluorescein dye to the buffer. For PMMA microchannels, the mobility was found to increase from (2.6 0.1) 10-4 cm2

Electron Backscatter Diffraction for Studies of Localized Deformation

March 1, 2003
Author(s)
R.H. Geiss, Alexana Roshko, Kristine A. Bertness, T Keller
Electron backscatter diffraction (EBSD) was used to study localized deformation in two types of constrained-volume materials. We present a study of deformation in narrow aluminum interconnects after low frequency, AC cycling at high current density. Joule

Embedded Capacitance Materials and Their Application in High Speed Designs

March 1, 2003
Author(s)
T Bergstresser, R Hilburn, Jan Obrzut, K. M. Phillips
In this paper, we review three material options for embedded capacitors: thin FR4 epoxy-glass laminate, adhesiveless copper on polyimide substrate, and unsupported epoxy filled with high dielectric constant ceramic powder. Characteristics including

Estimation of Q-factors and Resonant Factors

March 1, 2003
Author(s)
Kevin Coakley, Jolene Splett, Michael D. Janezic, Raian K. Kaiser
We estimate the quality factor Q and resonant frequency f 0 of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering parameter

Estimation of Q-Factors and Resonant Frequencies

March 1, 2003
Author(s)
Kevin J. Coakley, Jolene D. Splett, Michael D. Janezic, R F. Kaiser
We estimate the quality factor Q and resonant frequency f o of a microwave cavity based on resonance curve observations on an equally-spaced frequency grid. The observed resonance curve is the squared magnitude of an observed complex scattering parameter

Expected Multi-Hop Power Consumption in Mobile Ad-Hoc Networks

March 1, 2003
Author(s)
Camillo A. Gentile
Mobile Ad-Hoc Networks provide the means to reduce significantly the power required for routing from source to destination through multi-hops between other nodes in the network. In the presence of mobility, only continuous updating can guarantee routes

Exploring and Extending the Limits of CD-SEMs' Resolution

March 1, 2003
Author(s)
Andras Vladar, Michael T. Postek, John S. Villarrubia
This study of SEM resolution is occasioned by concerns that it is no longer adequate for lithography process control in integrated circuit manufacturing. For example, according to the most recent International Technology Roadmap for Semiconductors, the in

Face Recognition Vendor Test 2002 Performance Metrics

March 1, 2003
Author(s)
Patrick Grother, Ross J. Micheals, P. Jonathon Phillips
We present the methodology and recognition performance characteristics used in the Face Recognition Vendor Test 2002. We refine the notion of a biometric imposter, and show that the traditional measures of identification and verification performance are

Face Recognition Vendor Test 2002: Evaluation Report

March 1, 2003
Author(s)
P J. Phillips, Patrick J. Grother, Ross J. Micheals, D M. Blackburn, Elham Tabassi, M Bone
The Face Recognition Vendor Test (FRVT) 2002 is an independently administered technology evaluation of mature face recognition systems. FRVT 2002 provides performance measures for assessing the capability of face recognition systems to meet requirement for
Displaying 41601 - 41625 of 74090
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