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High-accuracy determination of the dependence of the photoluminescence emission energy on alloy composition in AlxGa1-xAs films



Larry Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, John Pellegrino, Kristine A. Bertness


In an effort to improve the accuracy of photoluminescence (PL) measurements of the Al mole fraction (x) of AlxGa1-xAs alloys, the PL peak emission energy, EPL,peak, was measured at room temperature for molecular-beam epitaxy-grown AlxGa1-xAs films with 0 less than or equal to} xless than}0.37, and correlated with independent measurements of x by in situ reflective igh-energy electron diffraction (RHEED) and also by ex situ wavelength-dispersive x-ray spectroscopy in an electron microprobe analyzer (WDS/EMPA). The measurement uncertainty of EPL,peak was minimized through the following procedures: Accurate calibration of the photon energy (or wavelength) scale, correction of the measured spectra for the spectrometer response function, fitting the data with a well-chosen line shape function, and compensation for the effect of ambient temperature drift. With these procedures, the 2ς measurement uncertainty of EPL,peak was of the order 5 x 10-4 eV for most samples. From correlation of the PL and WDS/EMPA composition data, the slope dEPL,peak/dx near room temperature was determined to be dEPL,peak/dx=(1.4017 ±0.0090 eV) -[(2.71±0.97)x 10-4 eV/K](T-298.3 K0. Correlation with the RHEED data gave the same result within measurement uncertainty. Previously published measurements of dE^dPL,peak/dx were reviewed and compared with the present study. The results of T.F. Kuech et al. [Appl. Phys. Lett. 51, 505 (1987)], based on nuclear resonant reaction analysis of the Al mole fraction, were found to be in good agreement with the present study after the addition of a correction term to account for the sample temperature difference (T=2 K for Kuech et al., T=298 K for present study). [DOI: 10.1063/1.1556554]
Journal of Applied Physics


Robins, L. , Armstrong, J. , Marinenko, R. , Paul, A. , Pellegrino, J. and Bertness, K. (2003), High-accuracy determination of the dependence of the photoluminescence emission energy on alloy composition in Al<sub>x</sub>Ga<sub>1-x</sub>As films, Journal of Applied Physics, [online], (Accessed May 29, 2024)


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Created March 31, 2003, Updated October 15, 2021