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Displaying 41426 - 41450 of 74191

Database-Assisted Design and Structural Reliability for Building Codes

May 1, 2003
Author(s)
S M. Diniz, Emil Simiu
We present a database-assisted design (DAD)-compatible probabilistic procedure for estimating (a)wind effects for any return period and (b) wind load factors. Unlike earlier reliability estimates, we account for the randomness of peak effects and for

Dependence of Electron Density on Fermi Energy in N-type Gallium Antimonide

May 1, 2003
Author(s)
Herbert S. Bennett, Howard Hung
The majority electron density as a function of the Fermi energy is calculated in zinc Blende, n-type GaSb for donor densities between 10 16 cm -3 and 10 19 cm -3. These calculations solve the charge neutrality equation self-consistently for a four-band

Dependence of Morphology on Miscut Angle for Si(111) Etched in NH(4)F

May 1, 2003
Author(s)
S Gonda, Joseph Fu, John A. Kramar, Richard M. Silver, Hui Zhou
Using scanning probe microscopy, we have examined the surfaces produced by etching several different vicinal Si(111) samples in NH(4)F aqueous solution. In agreement with others, we found that deoxygenation of the etchant generally reduces the number of

Dependency of Morphology on Miscut Angle for Si(111) Etched in NH 4 F

May 1, 2003
Author(s)
Joseph Fu, Hui Zhou, John A. Kramar, Richard M. Silver, S Gonda
Using scanning probe microscopy, we have examined the surfaces produced by etching several different vicinal Si(111) samples in NH 4F aqueous solution. In agreement with others, we found that deoxygenation of the etchant generally reduces the number of

Developments toward an Autonomous Robotic Crane for Automated Steel Construction

May 1, 2003
Author(s)
Kamel S. Saidi, Alan M. Lytle, Nicholas A. Scott
The NIST Construction Metrology and Automation Group, in cooperation with the NIST Intelligent Systems Division, is researching robotic structural steel placement as part of a project to develop an Automated Steel Construction Testbed. This project was

EBIT Diagnostics Using X-ray Spectra of Highly Ionized Ne

May 1, 2003
Author(s)
M Matranga, M Barbera, A Maggio, G Peres, S Serio, E Takacs, E Silver, John D. Gillaspy, H. Schnopper, J M. Laming, J. Beeman, E. E. Haller, N. Madden
We have carried out a detailed analysis of highly ionized neon spectra collected at the NIST EBIT using an NTD germanium X-ray microcalorimeter developed at the Harvard-Smithsonian Center for Astrophysics [1]. Our attention was focused especially on the Ne

Electron Beam Metrology of 193 nm Resists at Ultra Low Voltage

May 1, 2003
Author(s)
N. Sullivan, Ronald G. Dixson, B Bunday, M Mastovich, P Knutruda, P Fabre, R Brandoma
Resist slimming under electron beam exposure introduces significant measurement uncertainty in the metrology of 193 nm resists. Total critical dimension (CD) uncertainty of up to 10 nm can arise from line slimming through a combination of the line slimming

Electron Self-Energy Calculation Using a General Multi-Pole Approximation

May 1, 2003
Author(s)
J A. Soininen, J J. Rehr, Eric L. Shirley
We present a method for calculating the inverse of the dielectric matrix in a solid using a Band-Lanczos algorithm. The method produces a multi-pole approximation for the inverse dielectrix matrix with an arbitrary number of poles. We discuss how this

Fingerprint Interoperability Standards

May 1, 2003
Author(s)
R. McCabe
The commercialization of the Automatic Fingerprint Identification System (AFIS) began in the mid 1970s with the installation of five systems at the FBI. In subsequent years, additional vendors developed competing AFISs without considering any aspects of

Fluctuating Field Calculations for a Bimodal Medium

May 1, 2003
Author(s)
S Rao, Lawrence H. Bennett, Edward Della Torre, P J. Chen, R A. Fry
Bimodal magnetic behavior, has been observed in a multilayer film. In that film the Kerr rotation and ellipticity exhibit magneto-optic hystersis loops with two distinct field dependent steps so that there are four stable magnetization states. The magnetic

GLUT/Tk: Open GL with Tcl/Tk

May 1, 2003
Author(s)
Joseph Konczal
GLUT/Tk provides a mechanism for control of 3D graphics applications by a full-featured GUI system. It connects control windows written in Tk to OpenGL graphics windows managed by GLUT, with minimal disruption of each package's default program structure

Hierarchical Restoration Scheme for Multiple Failures in GMPLS Networks

May 1, 2003
Author(s)
San-Nan K. Lee, C Kim, David W. Griffith
It is expected that GMPLS-based recovery could become a viable option for obtaining faster restoration than layer 3 rerouting. Even though dedicated restoration ensures restorability of connections, exclusive use of dedicated scheme would result in wasting

IEEE TC-10: What's It All About?

May 1, 2003
Author(s)
Thomas E. Linnenbrink, W. B. Boyer, Nicholas Paulter, S. J. Tilden
The IEEE TC-10 comprises three working groups that have or are generating standards related to the measurement of signals. One of these groups has recently completed the IEEE Std. 1241, "Standard for Terminology and Test Methods for Analog-to-Digital

Implementation of a Reference Measurement System Using CD-AFM

May 1, 2003
Author(s)
Ronald G. Dixson, Theodore V. Vorburger, Angela Guerry, Marylyn H. Bennett, B Bunday
International SEMATECH (ISMT) and the National Institute of Standards and Technology (NIST) are working together to improve the traceability of atomic force microscope (AFM) dimensional metrology in semiconductor manufacturing. The rapid pace of

Influence of Cross-link Density on the Thermal Properties of Thin Polymer Network Films

May 1, 2003
Author(s)
Joseph~undefined~undefined~undefined~undefined~undefined Lenhart, Wen-Li Wu
Cross-linked epoxy network films were cast onto silicon wafers with a variety of surface treatments. X-ray reflectivity was used to characterize their electron density and thermal expansion in the rubbery state. A transition from bulk to confined expansion
Displaying 41426 - 41450 of 74191
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